Results 101 to 110 of about 762,917 (332)

Quantum Emitters in Hexagonal Boron Nitride: Principles, Engineering and Applications

Advanced Functional Materials, EarlyView.
Quantum emitters in hexagonal boron nitride have emerged as a promising candidate for quantum information science. This review examines the fundamentals of these quantum emitters, including their level structures, defect engineering, and their possible chemical structures.
Thi Ngoc Anh Mai, Md Shakhawath Hossain, Nhat Minh Nguyen, Yongliang Chen, Chaohao Chen, Xiaoxue Xu, Quang Thang Trinh, Toan Dinh, Toan Trong Tran   +8 more
wiley   +1 more source

SEMOS: a scanning electron microscope optical simulator for instrumental performance optimization

Journal of Analytical Science and Technology
In this study, a Scanning Electron Microscope Optical Simulator (SEMOS) was developed to provide an intuitive and quantitative understanding of electron-beam optics and to optimize lens operating parameters for improved SEM performance.
Cheolsu Han, Yong-Eun Kwon, Jong-Man Jeung, Tae-Yeoung Lee, Jin-Gyu Kim   +4 more
doaj   +1 more source

Evaluation of the dentinal wall adaptation ability of Mineral Trioxide Aggregate Fillapex, EndoSequence BC, and AH Plus sealers using Scanning Electron Microscope: An in vitro study

Endodontology
Aim: The present study was conducted to evaluate the dentinal wall adaptation ability of different root canal sealers (mineral trioxide aggregate Fillapex [MTA], EndoSequence BC [ESBC] Sealer, and AH Plus) using a scanning electron microscope (SEM ...
Pradipkumar R. Damor, Rajendra Kumar Tewari, Surendra Kumar Mishra, Syed Mukhtar-Un-Nisar Andrabi   +3 more
doaj   +1 more source

Scanning electron microscope analysis of sealant penetration and adaptation in contaminated fissures

Journal of Indian Society of Pedodontics and Preventive Dentistry, 2013
Objective: The objective of this study is to evaluate the penetration and adaptation of two different sealant materials applied under different conditions of contamination using scanning electron microscope (SEM) analysis.
Asma Al-Jobair
doaj   +1 more source

Information Transfer Capability and Signal Processing Performance of Modern Scanning Electron Microscopes [PDF]

, 2003
Zsolt Radí, András Vládar, Michael T. Postek   +2 more
openalex   +1 more source

Determination of the Number of Graphene Layers: Discrete Distribution of the Secondary Electron Intensity Derived from Individual Graphene Layers

, 2010
Using a scanning electron microscope, we observed a reproducible, discrete distribution of secondary electron intensity stemming from an atomically thick graphene film on a thick insulating substrate.
Hiura, Hidefumi, Miyazaki, Hisao, Tsukagoshi, Kazuhito   +2 more
core   +1 more source

NanoMOF‐Based Multilevel Anti‐Counterfeiting by a Combination of Visible and Invisible Photoluminescence and Conductivity

Advanced Functional Materials, EarlyView.
This study presents novel anti‐counterfeiting tags with multilevel security features that utilize additional disguise features. They combine luminescent nanosized Ln‐MOFs with conductive polymers to multifunctional mixed‐matrix membranes and powder composites. The materials exhibit visible/NIR emission and matrix‐based conductivity even as black bodies.
Moritz Maxeiner, Ruben Maile, Murat Cuvalli, Andreas Wolf, Ayisha Komal, Robert Oestreich, Christoph Janiak, Karl Mandel, Alexander Knebel, Klaus Müller‐Buschbaum   +9 more
wiley   +1 more source

Synchrotron Radiation for Quantum Technology

Advanced Functional Materials, EarlyView.
Materials and interfaces underpin quantum technologies, with synchrotron and FEL methods key to understanding and optimizing them. Advances span superconducting and semiconducting qubits, 2D materials, and topological systems, where strain, defects, and interfaces govern performance.
Oliver Rader, Sakura Pascarelli, Klaus Attenkofer, Anna A. Makarova, Karsten Holldack, Kai Rossnagel, Kristiaan Temst, George Kourousias, Stefano Carretta, Caterina Biscari, Helmut Dosch   +10 more
wiley   +1 more source

Research on micro/nano scale 3D reconstruction based on scanning electron microscope

Frontiers in Energy Research
Scanning electron microscopy (SEM) has an important application in the petroleum field, which is often used to analyze the microstructure of reservoir rocks, etc. Most of these analyses are based on two-dimensional images.
Huibao Dong, Huibao Dong, Hongliang Jia, Hongliang Jia, Dahui Qin, Dahui Qin, Dawei Hu   +6 more
doaj   +1 more source

A simplified focusing and astigmatism correction method for a scanning electron microscope

AIP Advances, 2018
Defocus and astigmatism can lead to blurred images and poor resolution. This paper presents a simplified method for focusing and astigmatism correction of a scanning electron microscope (SEM). The method consists of two steps. In the first step, the fast
Yihua Lu, Xianmin Zhang, Hai Li
doaj   +1 more source