Results 61 to 70 of about 1,312,739 (385)
A Scanning Probe Microscope in My Scanning Electron Microscope? [PDF]
Abstract Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other.
openaire +2 more sources
Elasticity of Diametrically Compressed Microfabricated Woodpile Lattices
Modulus–porosity relationship is derived for woodpile lattices with struts under diametrical compression. The formula presented here that Young's modulus is proportional to the square of the volume fraction E˜ρ2$E \sim \left(\rho\right)^{2}$ is shown to be consistent with computations and laboratory experiments on 3D‐printed samples.
Faezeh Shalchy, Atul Bhaskar
wiley +1 more source
Deep convolutional neural networks to restore single-shot electron microscopy images [PDF]
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of experimental images is often hampered by stochastic and deterministic distortions arising from the instrument or ...
arxiv
Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope [PDF]
The quest to understand correlated electronic systems has pushed the frontiers of experimental measurements toward the development of new experimental techniques and methodologies. Here we use a novel home-built uniaxial-strain device integrated into our variable temperature scanning tunneling microscope that enables us to controllably manipulate in ...
arxiv +1 more source
A Load-Lock-Compatible Nanomanipulation System for Scanning Electron Microscope
This paper presents a nanomanipulation system for operation inside scanning electron microscopes (SEM). The system is compact, making it capable of being mounted onto and demounted from an SEM through the specimen-exchange chamber (load-lock) without ...
Y. Zhang+4 more
semanticscholar +1 more source
Spatial distribution of microstructure in Inconel 718 3D‐printed with bidirectional strategy with no rotation and chessboard strategy is studied. The former results in a highly ordered arrangement of coarse grains separated by line clusters of dislocation‐dense fine grains. This arrangement is disrupted by the chessboard strategy.
Jalal Al‐Lami+4 more
wiley +1 more source
Elaphostrongylus spp. from Scandinavian cervidae - a scanning electron microscope study (SEM)
Nematodes of the genus Elaphostrongylus collected from moose (Alces alces L.), reindeer (Rangifer tarandus tarandus L.), and red deer (Cervus elaphus L.), respectively, were studied by means of scanning electron microscopy.
Margareta Stéen, Carina Johansson
doaj +1 more source
In this study, OpenPhase software is used to simulate low‐carbon bainitic steels. The lower holding temperature sample exhibits smaller and finer grains. Grain thickness measurements of bainitic ferrite from simulations align with the experimental observations at high temperature. Bainitic steels are extensively utilized across various sectors, such as
Dhanunjaya K. Nerella+7 more
wiley +1 more source
Multilayer ferrite inductor prototypes are fabricated by cofiring metallized tapes of NiCuZn ferrite and glass‐ceramic composite. Prerequisites for a predictive component simulation are discussed. An automated data‐pipeline stores and semantically links the experimental data acquired in the study according to a domain ontology.
Björn Mieller+8 more
wiley +1 more source
This manuscript presents advances in digital transformation within materials science and engineering, emphasizing the role of the MaterialDigital Initiative. By testing and applying concepts such as ontologies, knowledge graphs, and integrated workflows, it promotes semantic interoperability and data‐driven innovation. The article reviews collaborative
Bernd Bayerlein+44 more
wiley +1 more source