Results 141 to 150 of about 509,762 (201)

Calibration of a Scanning Electron Microscope: 1. Selection of the SEM Parameters

Journal of Surface Investigation, 2021
The influence of the parameters of a scanning electron microscope (SEM) on its calibration using test objects with a trapezoidal profile and large inclination angles of the side walls is studied. The focusing of the SEM probe and the energy of its electrons affect SEM calibration in the modes of collecting secondary slow electrons and backscattered ...
exaly   +2 more sources

SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope

Microscopy and Microanalysis, 2022
The simulation program “SEM Nano” is introduced to explain and visualize probe formation in field-emission scanning electron microscopes (SEMs). The program offers an easy and intuitive graphical user interface (GUI) to provide input in terms of understandable SEM parameters and visualization of the output.
Surya Kamal, Richard K. Hailstone
openaire   +2 more sources

SEM (Scanning Electron Microscope) Studies of Aortic Structure

Journal of Vascular Research, 1973
Scanning electron microscopy reveals the following features of the microstructure of the rabbit aorta: endothelial folds, including luminal and interior structure, connecting ‘bridges’ between the folds and concentric layers of membranes in the cross-section.
G M, Chisolm, J L, Gainer, G E, Stoner
openaire   +2 more sources

Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)

Proceedings, annual meeting, Electron Microscopy Society of America, 1986
Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample.
Oliver C. Wells, Mark E. Welland
openaire   +1 more source

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