Results 251 to 260 of about 397,310 (297)

Normal and lateral forces in scanning force microscopy

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1994
With an atomic force/friction force microscope operating in the constant force mode and with an optical lever technique as a deflection sensor, we have investigated the total force acting on the cantilever tip during the raster scanning of the sample surface. A model including the normal and lateral components of the force has been worked out.
ASCOLI C, DINELLI F, FREDIANI C, PETRACCHI D, SALERNO M, LABARDI M, ALLEGRINI M, FUSO F   +7 more
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Scanning Force Microscopy

1994
Abstract Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage ...
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Scanning Tunneling and Atomic Force Microscopies

1994
The scanning tunneling microscope (STM) developed by Binnig and Rohrert(1–3) at the IBM Zurich research laboratory in the early 1980s was the first example of a new family of instruments based on a concept radically different from that of the optical and electron microscopes.
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Instrumentation for Scanning Force Microscopy and Friction Force Microscopy

1997
Scanning Force Microscopes and Friction Force Microscopes are built in wide variety of designs. They have become welcome additions to industrial laboratories due to their ruggedness and because their measurement principle is, in many respects, a refinement of well established apparatus such as profilometers and tribometers.
openaire   +1 more source

Scanning probe microscopy

Nature Reviews Methods Primers, 2021
Ke Bian, Christoph Gerber, Andreas Heinrich   +2 more
exaly  

SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY

2006
Hembacher, Stefan, Giessibl, Franz Josef
openaire   +2 more sources

Single-molecule electron spin resonance by means of atomic force microscopy

Nature, 2023
Lisanne Sellies, Jascha Repp, Philipp Scheuerer   +2 more
exaly  

Scanning force microscopy

Materials Research Bulletin, 1996
openaire   +1 more source

Forces in Scanning Probe Microscopy

1995
This work is intended to develop a microscopic analysis of forces in scanning force microscopy. First, Coulomb interactions are classified for different ranges of tip-sample separation. Following a simple description for the origin of short range interactions, rigorous methods based on the self-consistent-field calculation in momentum space, as well as
openaire   +1 more source

SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY

Surface Review and Letters, 1995
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