Results 61 to 70 of about 840,881 (357)

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

Beilstein Journal of Nanotechnology, 2020
The combination of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily available via a single imaging mode.
Jeremiah Croshaw, Thomas Dienel, Taleana Huff, Robert Wolkow   +3 more
doaj   +1 more source

Atomic-scale distribution of water molecules at the mica-water interface visualized by three-dimensional scanning force microscopy.

Physical Review Letters, 2010
We have developed a method referred to as three-dimensional scanning force microscopy (3D-SFM) which enables us to visualize water distribution at a solid-liquid interface with an atomic-scale resolution in less than 1 min. The 3D-SFM image obtained at a
T. Fukuma, Y. Ueda, Shunsuke Yoshioka, H. Asakawa   +3 more
semanticscholar   +1 more source

#6669 ANALYSIS OF KIDNEY BIOPSIES AND URINE SEDIMENT USING SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM) [PDF]

, 2023
Giuseppe Gigliotti, Michelangelo Nigro, Andrea Gigliotti, Gianmarco Borriello, António Fernandes Massa, Antonio Mancini, Scognamiglio Mariarosa, Ernesto Reverchon, Davide Viggiano   +8 more
openalex   +1 more source

An Inkjet‐Printed Platinum‐Based Temperature Sensing Element on Polyimide Substrates

Advanced Engineering Materials, EarlyView.
An inkjet‐printed, meander‐structured, nanoparticle platinum‐based resistive temperature sensors on polyimide substrates are demonstrated as proof‐of‐concept. Optimized sintering at 250°C enables stable conductive structures. The Pt100‐ and Pt1000‐type sensors exhibit linear resistance–temperature characteristics with stable TCR in the 20°C–80°C range,
Shawon Alam, Thomas Kister, Alexander Scholz, Sophie Sauva, Makara Lay, Tobias Kraus, Jasmin Aghassi‐Hagmann   +6 more
wiley   +1 more source

Atomic Force Microscopy Application in Biological Research: A Review Study

Iranian Journal of Medical Sciences, 2013
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp ...
Surena Vahabi, Bahareh Nazemi Salman, Anahita Javanmard   +2 more
doaj  

Weakly perturbative imaging of interfacial water with submolecular resolution by atomic force microscopy

Nature Communications, 2018
Scanning probe microscopy has been extensively applied to probe interfacial water in many interdisciplinary fields but the disturbance of the probes on the hydrogen-bonding structure of water has remained an intractable problem.
Jinbo Peng, Jing Guo, P. Hapala, Duanyun Cao, Runze Ma, Bowei Cheng, Limei Xu, M. Ondráček, P. Jelínek, E. Wang, Ying Jiang   +10 more
semanticscholar   +1 more source

A Workflow to Accelerate Microstructure‐Sensitive Fatigue Life Predictions

Advanced Engineering Materials, EarlyView.
This study introduces a workflow to accelerate predictions of microstructure‐sensitive fatigue life. Results from frameworks with varying levels of simplification are benchmarked against published reference results. The analysis reveals a trade‐off between accuracy and model complexity, offering researchers a practical guide for selecting the optimal ...
Luca Loiodice, Krzysztof S. Stopka, Michael D. Sangid   +2 more
wiley   +1 more source

Two Approaches in Computer Simulation of the MFM-images [PDF]

Журнал нано- та електронної фізики, 2015
Two approaches to the interpretation of the data of magnetic force microscopy are considered. The first approach involves the reconstruction of the magnetization distribution in the researched samples on the base of an assumption about the magnetic state
E.A. Mozharova, K.V. Nefedev
doaj  

Study on Elementary Process of Adhesive Wear Using Scanning Probe Microscopy

Tribology Online, 2016
In the elementary process of adhesive wear, wear elements, which are the elemental debris of wear particles, are generated at junctions of asperities, and subsequently grow into transfer particles between sliding surfaces through a mutual transfer and ...
Alan Hase, Hiroshi Mishina
doaj   +1 more source