Results 71 to 80 of about 397,310 (297)

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

Beilstein Journal of Nanotechnology, 2020
The combination of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily available via a single imaging mode.
Jeremiah Croshaw, Thomas Dienel, Taleana Huff, Robert Wolkow   +3 more
doaj   +1 more source

High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy

Nature Communications, 2023
Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these ...
Marti Checa, Addis S. Fuhr, Changhyo Sun, Rama Vasudevan, Maxim Ziatdinov, Ilia Ivanov, Seok Joon Yun, Kai Xiao, Alp Sehirlioglu, Yunseok Kim, Pankaj Sharma, Kyle P. Kelley, Neus Domingo, Stephen Jesse, Liam Collins   +14 more
doaj   +1 more source

Phase imaging with intermodulation atomic force microscopy

, 2009
Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive ...
Arndt C. von Bieren, Binnig, Carsten Hutter, Cleveland, Daniel Platz, David B. Haviland, Erik A. Tholén, Higgins, Hillenbrand, Hu, Hu, Jesse, Lee, Lozano, Martinez, Paulo, Platz, Preiner, Rodriguez, Sahin, Sahin, Stark, Stark   +22 more
core   +1 more source

Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

Advanced Engineering Materials, EarlyView.
Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer, Eric R. Hoglund, Anton V. Ievlev, Patrick E. Hopkins   +3 more
wiley   +1 more source

Atomic Force Microscopy Application in Biological Research: A Review Study

Iranian Journal of Medical Sciences, 2013
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp ...
Surena Vahabi, Bahareh Nazemi Salman, Anahita Javanmard   +2 more
doaj  

Removing the parachuting artifact using two-way scanning data in high-speed atomic force microscopy

Biophysics and Physicobiology, 2023
The high-speed atomic force microscopy (HS-AFM) is a unique and prominent method to observe structural dynamics of biomolecules at single molecule level at near-physiological condition.
Shintaroh Kubo, Kenichi Umeda, Noriyuki Kodera, Shoji Takada   +3 more
doaj   +1 more source

Mechanism of Polarization Fatigue in BiFeO3: the Role of Schottky Barrier

, 2013
By using piezoelectric force microscopy and scanning Kelvin probe microscopy, we have investigated the domain evolution and space charge distribution in planar BiFeO3 capacitors with different electrodes.
Chen, Lang, Guo, Rui, Lim, Zhi Shiuh, Wang, Junling, You, Lu, Yuan, Guoliang, Zhou, Yang, Zou, Xi   +7 more
core   +1 more source

Low‐Cost, Large‐Scale Nanoporous Metals by Mechanical Alloying, Oxide Reduction, and Dealloying of Powders

Advanced Engineering Materials, EarlyView.
Powder metal processing provides scalable advantages in nanoporous (np) metal development. Mechanical alloying is used to produce unique precursors for hybrid nanopore formation by oxide reduction and dealloying. As demonstrated in np Ag, this approach improves process efficiency while promoting smaller ligaments and larger pores, both of which are ...
Mark A. Atwater, Oliver A. Fowler
wiley   +1 more source

Study on Elementary Process of Adhesive Wear Using Scanning Probe Microscopy

Tribology Online, 2016
In the elementary process of adhesive wear, wear elements, which are the elemental debris of wear particles, are generated at junctions of asperities, and subsequently grow into transfer particles between sliding surfaces through a mutual transfer and ...
Alan Hase, Hiroshi Mishina
doaj   +1 more source