Results 21 to 30 of about 4,360,674 (289)

MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy

Crystals, 2020
A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko, Vadim Evtikhiev, Dmitry Revin, Andrey Krysa   +3 more
doaj   +1 more source

Mechanical degradation of magnetic pulse welded Al–Fe joint in neutral salt environment

Journal of Materials Research and Technology, 2021
The urgent need in lightweight of vehicle body promoted the application of multi materials with high specific strength, and this involves the reliable welding of dissimilar materials.
Huihui Geng, Junjia Cui, Guangyao Li, Jingqi Mao, Liang Ye   +4 more
doaj   +1 more source

The nature of condensed single molecules : local electronic and mechanical characteristics [PDF]

, 2014
In order to advance the performance of molecule based electronic devices a detailed and fundamental knowledge about the underlying physical aspects is mandatory.
Fremy, Sweetlana Deva
core   +1 more source

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2020
Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz, Tino Wagner, Andreas Stemmer   +2 more
doaj   +1 more source

Sodium dodecyl sulfate (SDS) as an effective corrosion inhibitor for Mg-8Li-3Al alloy in aqueous NaCl: A combined experimental and theoretical investigation

Journal of Magnesium and Alloys, 2023
The corrosion inhibition behavior of Mg-8Li-3Al alloy in NaCl solution with sodium dodecyl sulfate (SDS) was investigated by hydrogen analysis, scanning electron microscopy (SEM), electrochemical test, scanning Kelvin probe force microscopy (SKPFM) and ...
Honggun Song, Zhidong Xu, Lahouari Benabou, Zheng Yin, Hongyu Guan, Hong Yan, Luo Chao, Zhi Hu, Xudong Wang   +8 more
doaj   +1 more source

Scanning electrochemical microscopy as a local probe of oxygen permeability in cartilage [PDF]

, 2000
The use of scanning electrochemical microscopy, a high-resolution chemical imaging technique, to probe the distribution and mobility of solutes in articular cartilage is described.
O'Hare, D. (Danny), Gonsalves, Marylou, Unwin, Patrick R., Macpherson, Julie V., Barker, Anna L., Winlove, C. Peter   +5 more
core   +1 more source

Electronic structures and optical characteristics of fluorescent pyrazinoquinoxaline assemblies and Au interfaces

Scientific Reports, 2021
Understanding the excitonic processes at the interfaces of fluorescent π-conjugated molecules and metal electrodes is important for both fundamental studies and emerging applications. Adsorption configurations of molecules on metal surfaces significantly
Soyeong Kwon, Dong Yeun Jeong, Weon-Sik Chae, Kyungju Noh, P. Devi, Luciano Colazzo, Youngmin You, Taeyoung Choi, Dong-Wook Kim   +8 more
doaj   +1 more source

Thin NaCl films on silver (001): island growth and work function

New Journal of Physics, 2012
The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh, Claude R Henry, Clemens Barth   +2 more
doaj   +1 more source

Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics, 2021
Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg, Lukas Wehmeier, Denny Lang, Susanne C. Kehr, Lukas M. Eng   +4 more
doaj   +1 more source