Results 1 to 10 of about 2,228,604 (285)

Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy [PDF]

open access: yesApplied Physics Letters, 2010
We report scanning Kelvin probe microscopy (SKPM) of single crystal difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of contact effects and reveals that degradation of device performance occurs over a time period of ...
John E Anthony   +2 more
exaly   +5 more sources

A Duality Between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy

open access: yesAdvanced Materials Interfaces
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work‐function variations of conductive surfaces, it can also be used to probe the ...
Isaac C.D. Lenton   +3 more
doaj   +3 more sources

Investigation of Hydrogen Evolution and Enrichment by Scanning Kelvin Probe Force Microscopy

open access: yesElectrochemistry Communications, 2013
Abstract It has been a challenge to detect the real-time distribution of hydrogen at the micro-level. In this study, a scanning Kelvin probe force microscopy (SKPFM) was employed to characterize the surface potential changes induced by hydrogen. Variations of the surface potential were used to assess (a) the real-time distribution of hydrogen, (b ...
Yu Yan, Jinxu Li
exaly   +2 more sources

Imaging Graphene Moiré Superlattices via Scanning Kelvin Probe Microscopy [PDF]

open access: yesNano Letters, 2021
15 pages, 4 ...
Junxi Yu   +7 more
openaire   +4 more sources

Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy

open access: yesC, 2023
A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bilayer
Sergey P. Lebedev   +4 more
doaj   +1 more source

In situ microscopic investigation of ion migration on the surface of chromium coated steels

open access: yesnpj Materials Degradation, 2022
Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar   +2 more
doaj   +1 more source

Application of Micro-Area Electrochemical Measurement Technique in Metal Galvanic Corrosion [PDF]

open access: yesCailiao Baohu, 2023
Micro-area electrochemical measurement technique can detect metal galvanic corrosion in situ at the micron or even sub-micron scale, which provides a new way for further study of metal galvanic corrosion.
WANG Tong, LI Chang-guang, LI Zhao-bin
doaj   +1 more source

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

open access: yesData in Brief, 2020
This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park   +3 more
doaj   +1 more source

High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy

open access: yesNature Communications, 2023
Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these ...
Marti Checa   +14 more
doaj   +1 more source

Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]

open access: yesPLoS ONE, 2017
Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
doaj   +1 more source

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