Results 181 to 190 of about 2,073,769 (233)

Copper phosphate nanozymes combat implant-related infections by inducing cuproptosis-like death and inhibiting the two-component system. [PDF]

Bioact Mater
Liu Y, Zheng Y, Tian D, Sun Y, Wang M, Li S, Tao E, Liao Y, Huang F, Wang T, Wang X.   +10 more
europepmc   +1 more source

20pGP-5 Tracking free and localized electrons by scanning probe microscopy(Force Spectroscopy and Tunneling Spectroscopy by SPM and related techniques)

Meeting Abstracts of the Physical Society of Japan, 2010
openaire   +1 more source

Spiers Memorial Lecture: Vibrations at interfaces.

Faraday Discuss
Backus EHG, Dickbreder T, Hofmann M, Saak CM, Zelenka M.   +4 more
europepmc   +1 more source

Atomic force nanorheology for <i>in situ</i> exploration of nanoscale SEI layers in real-life rechargeable-battery electrodes.

Faraday Discuss
Nagarathinam M, Chen Y, Kolosov O.
europepmc   +1 more source

Periodicity as a Universal Measurand Enabling Traceable Nanoscale Dimensional Metrology

Lupi FF, Murataj I, Altmann K, Arslan BG, Baruffaldi D, Boarino L, Bortolini C, Bozat O, Buajarern J, Cara E, Celano U, Chen H, Ciesielski R, Clifford C, Chiarcos R, De Wolf P, Giovannozzi A, Gollwitzer C, Grazianetti C, Kim DK, Klapetek P, Kline RJ, Laus M, Lin F, Marini M, Martella C, Menghini M, Caligaris FO, Pedraz P, Singh S, Singh SP, Soltwisch V, Su C, Su C, Tawale JS, Torre B, Valtr M, Vladar A, Wood S, Cabral V, Milano G.   +40 more
europepmc   +1 more source

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Scanning Probe Microscopy (SPM)

2019
This chapter focuses on the SPM techniques that can be useful for the study of soft interface sciences. Different from the optical and electron microscopes, the SPM has no requirements on light source and lens, and therefore, the resolution has no limitation due to the wavelength of light and optical aberration.
Reiko Azumi, Yoshihiro Kikkawa
exaly   +2 more sources

Precise Nanoscale Measurements with Scanning Probe Microscopy (SPM): A Review

Journal of Nanoscience and Nanotechnology, 2017
For many of measurements, it is important to know the interaction of the measuring device with the artefact being measured in order to determine the accurate magnitude of the quantity. Mechanical, electrical, magnetic, optical and chemical properties of materials are also important parameters that need to be quantified at the micro and nanometre level.
Yunbo Shi, Zongmin Ma, Zhang Qu
exaly   +3 more sources

Evaluation of the Nanoimprinting Process Using Scanning Probe Microscopy (SPM)

Nanoscience and Technology, 2012
Nanoimprint lithography (NIL) is a technology that allows the fabrication of low-cost nanostructure devices at high throughput and accuracy. The most popular NIL method is ultraviolet (UV) nanoimprinting because it is a room-temperature process that does not require a thermal cycle.
Makoto Okada, Shinji Matsui
exaly   +2 more sources

The Art of SPM: Scanning Probe Microscopy in Materials Science

Advanced Materials, 2005
AbstractIn this Progress Report, outstanding scientific applications of scanning probe microscopy (SPM) in the field of materials science and the latest technique developments are introduced and discussed. Besides being able to image the organization of matter with sub‐nanometer resolution, SPM, owing to its basic operating principle, provides the ...
exaly   +2 more sources

Tunable Spatial Resolution of a Scanning Probe Microscopy (SPM) by an Efficient Cryosorption Pump

IEEE Sensors Journal, 2023
A Venimadhav, Rajesh Kumar Rajagopal, Abhay Singh Gour   +2 more
exaly   +2 more sources