Results 191 to 200 of about 2,073,769 (233)
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Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM)
2018exaly +2 more sources
Electrochemical and optical processing of microstructures by scanning probe microscopy (SPM)
Proceedings of Ninth International Workshop on Micro Electromechanical Systems, 2002Two micro processing techniques based on scanning probe microscopy (SPM) are described. One is electrochemical etching and deposition using a scanning tunneling microscope (STM). STM is very useful tool of nm-scaled observation, and it can be also used as precise positioner in micro processing. In micro electrochemical processing system, a potentiostat
M. Suda +5 more
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Ultramicroscopy, 2008
If the photodetector and cantilever of an atomic force microscope (AFM) are not properly adjusted, crosstalk effects will appear. These effects disturb measurements of the absolute vertical and horizontal cantilever deflections, which are involved in friction force microscopy (FFM).
Pavel, Prunici, Peter, Hess
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If the photodetector and cantilever of an atomic force microscope (AFM) are not properly adjusted, crosstalk effects will appear. These effects disturb measurements of the absolute vertical and horizontal cantilever deflections, which are involved in friction force microscopy (FFM).
Pavel, Prunici, Peter, Hess
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Scanning Probe Microscopy SPM InvestigationsApplied to Cathodic Modification of Platinum Surface
ECS Meeting Abstracts, 2006Abstract not Available.
Jalal Ghilane +6 more
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Advanced applications and instrumentation for scanning probe microscopy (SPM)
Proceedings, annual meeting, Electron Microscopy Society of America, 1996Scanning probe microscopy (SPM) has continued to advance into new applications and disciplines every year. The development of new techniques and instrumentation for SPM's have enabled researchers to study sample surfaces in a variety of ambient conditions and using a number of contrast mechanisms. A review of new SPM techniques and instrumentation will
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Characterization of Thin Films Using Different Scanning Probe Microscopy (SPM) Modes
Microscopy and Microanalysis, 2005Scanning probe microscopy (SPM) is unique among the imaging techniques in which it provides three-dimensional (3-D) real-space images and among surface analysis techniques in which it allows spatially localized measurements of structure and properties. Under optimum conditions, subatomic spatial resolution is achieved.
D. M. Marulanda, D. F. Arias, A. Devia
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Characteristics of low field-emission diamond films by scanning probe microscopy (SPM)
Diamond and Related Materials, 2001Abstract Field emission from the polycrystalline diamond film prepared by a two-step hot filament (HF) CVD method showed a turn-on field of 1.7 V μm−1. To understand the low field-emission mechanism, nanoscale characteristics of both step films, the bias enhanced nucleation (BEN) film, and the subsequent poly-diamond film, were investigated by SPM ...
Li Zhang +3 more
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Solid State Communications, 2002
We describe the construction and operation of an atomic force microscope based on a tuning fork sensor with probe tips obtained from commercially available cantilevers. Only the tip from the cantilever is mounted on the tuning fork, minimizing the change in resonant frequency and the quality factor Q of the tuning fork.
S Rozhok, V Chandrasekhar
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We describe the construction and operation of an atomic force microscope based on a tuning fork sensor with probe tips obtained from commercially available cantilevers. Only the tip from the cantilever is mounted on the tuning fork, minimizing the change in resonant frequency and the quality factor Q of the tuning fork.
S Rozhok, V Chandrasekhar
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Fabrication of Nano-scale Reference Materials with Scanning Probe Microscopy (SPM)-based Lithography
2006 1st IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2006Three SPM-based techniques are put forward to fabricate ID and 2D nano-scale Reference Materials, i.e. Atomic Force Microscopy (AFM) tip-induced anodic oxidation on Si substrate, Scanning Tunneling Microscopy(STM) current-induced oxidation on Ti film as well as AFM tip-scratching on Au film. The experimental parameters are analyzed and classified.
Wei-Xuan Jing +4 more
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