Results 211 to 220 of about 2,073,769 (233)
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Probe Technology of Scanning Probe Microscopy (SPM) and Its Fabrication Technology
2012Patrick M. Winter +34 more
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Micron
Scanning probe microscopy (SPM), particularly atomic force microscopy (AFM), is essential for characterizing materials at the nanometer scale. However, practical challenges such as image quality degradation and throughput limitations persist, even with advancements in automation.
openaire +2 more sources
Scanning probe microscopy (SPM), particularly atomic force microscopy (AFM), is essential for characterizing materials at the nanometer scale. However, practical challenges such as image quality degradation and throughput limitations persist, even with advancements in automation.
openaire +2 more sources
Capacitive Measurements of SiO2 Films of Different Thicknesses Using a MOSFET-Based SPM Probe
Sensors, 2021Wonkyu Moon, Hoontaek Lee
exaly
Scanning probe microscopy (SPM) of epitaxial oxide thin films
2015H. Guo, J. Zhang
openaire +1 more source
The role of convolutional neural networks in scanning probe microscopy: a review
Beilstein Journal of Nanotechnology, 2021Georg Fantner +2 more
exaly
Ultralow Dissipation Patterned Silicon Nanowire Arrays for Scanning Probe Microscopy
Nano Letters, 2020William Rose +2 more
exaly
Artificial-intelligence-driven scanning probe microscopy
Communications Physics, 2020Peter Hirsch, Agustin Schiffrin
exaly

