Results 201 to 210 of about 2,073,769 (233)
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International Journal of Electronics, 1996
Thin films of uncoated bisphenol-A-polycarbonate (PC) were progressively crystallized in a controllable manner under the action of butyl acetate. The PC sample was imaged using AFM in both the contact and tapping modes throughout the crystallization process.
H. R. HARRON +3 more
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Thin films of uncoated bisphenol-A-polycarbonate (PC) were progressively crystallized in a controllable manner under the action of butyl acetate. The PC sample was imaged using AFM in both the contact and tapping modes throughout the crystallization process.
H. R. HARRON +3 more
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Surface structure of the PAN‐based carbon fibres studied by the scanning probe microscopy (SPM)
Surface and Interface Analysis, 1994Abstract Scanning tunnelling microscopy (STM) and scanning force microscopy (SFM) have been applied to characterize the surface topography of carbon fibres before and after activating electrochemical treatment. Electrochemical activation is seen to have a significant effect on the structure of the surface layers.
P. A. Zhdan, D. Grey, J. E. Castle
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Tip Geometry and Tip-Sample Interactions in Scanning Probe Microscopy (SPM)
2006Scanning probe microscopes allow to resolve small structures with very high resolution. Therefore, these instruments are essential for dimensional metrology from micro to atomic scale. The image obtained, however, is more than a morphological operation linking tip and sample geometry.
Ludger Koenders, Andrew Yacoot
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Measurement Science and Technology, 2011
Atomic force microscopy is a diagnostic technique offering sub-micron resolution in both lateral and vertical scales due to observation of interactions between a sharp scanning tip and the surface. Before the sample is scanned, the tip must approach the surface and this process is one of the most critical procedures in terms of the risk of damaging the
Andrzej Sikora, Lukasz Bednarz
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Atomic force microscopy is a diagnostic technique offering sub-micron resolution in both lateral and vertical scales due to observation of interactions between a sharp scanning tip and the surface. Before the sample is scanned, the tip must approach the surface and this process is one of the most critical procedures in terms of the risk of damaging the
Andrzej Sikora, Lukasz Bednarz
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MRS Proceedings, 1999
ABSTRACTThin films of high-k dielectric/ferroelectric materials such as BaxSr1−xTiO3(BST), PbZrxTi1−xO3(PZT) and SrBi2Ta2O9(SBT) are currently investigated for integration into high-density CMOS technology. Characterization of these materials by SPM techniques combines imaging of the morphology and microstructure of these films and recording of various
S.A. Landau +9 more
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ABSTRACTThin films of high-k dielectric/ferroelectric materials such as BaxSr1−xTiO3(BST), PbZrxTi1−xO3(PZT) and SrBi2Ta2O9(SBT) are currently investigated for integration into high-density CMOS technology. Characterization of these materials by SPM techniques combines imaging of the morphology and microstructure of these films and recording of various
S.A. Landau +9 more
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International Symposium for Testing and Failure Analysis, 2005
Abstract A method to measure “on site” programmed charges in EEPROM devices is presented. Electrical Scanning Probe Microscopy (SPM) based techniques such as Electric Force Microscopy (EFM) and Scanning Kelvin Probe Microscopy (SKPM) are used to directly probe floating gate potentials.
Christophe De Nardi +4 more
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Abstract A method to measure “on site” programmed charges in EEPROM devices is presented. Electrical Scanning Probe Microscopy (SPM) based techniques such as Electric Force Microscopy (EFM) and Scanning Kelvin Probe Microscopy (SKPM) are used to directly probe floating gate potentials.
Christophe De Nardi +4 more
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Translational Materials Research, 2016
Scanning probe microscopy (SPM) offers many advantages in materials characterization including a resolution range from over 100 microns down to the nanoscale and beyond. In addition to its superior resolution, SPM images samples under real-world conditions such as liquid or ambient environments resulting in a very powerful and flexible tool.
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Scanning probe microscopy (SPM) offers many advantages in materials characterization including a resolution range from over 100 microns down to the nanoscale and beyond. In addition to its superior resolution, SPM images samples under real-world conditions such as liquid or ambient environments resulting in a very powerful and flexible tool.
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Thin Solid Films, 2004
Abstract Oxide on Si wafers can be manipulated by a scanning probe microscope (SPM) operated in the electrical conductivity mode (ECM), by several distinctly different mechanisms (i.e. anodic oxidation, dielectric break-down, and lateral transport of silicaceous species). The mechanisms can, in principle, support the full sequence of write–read–erase–
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Abstract Oxide on Si wafers can be manipulated by a scanning probe microscope (SPM) operated in the electrical conductivity mode (ECM), by several distinctly different mechanisms (i.e. anodic oxidation, dielectric break-down, and lateral transport of silicaceous species). The mechanisms can, in principle, support the full sequence of write–read–erase–
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2013
This research work is aimed at understanding the electronic properties of Bi(110) nanostructures. This study chiefly uses Scanning Tunneling Microscopy (STM), Scanning Tunneling Spectroscopy (STS) and Non Contact Atomic Force Microscope (NCAFM) to investigate the geometric and electronic structure of Bi(110) islands on highly oriented pyrolytic ...
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This research work is aimed at understanding the electronic properties of Bi(110) nanostructures. This study chiefly uses Scanning Tunneling Microscopy (STM), Scanning Tunneling Spectroscopy (STS) and Non Contact Atomic Force Microscope (NCAFM) to investigate the geometric and electronic structure of Bi(110) islands on highly oriented pyrolytic ...
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