Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS). [PDF]
Priebe A, Michler J.
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Time of flight secondary ion mass spectrometry imaging of contaminant species in chemical vapour deposited graphene on copper. [PDF]
Brennan B +4 more
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Studies of Benzotriazole on and into the Copper Electrodeposited Layer by Cyclic Voltammetry, Time-of-Flight Secondary-Ion Mass Spectrometry, Atomic Force Microscopy, and Surface Enhanced Raman Spectroscopy. [PDF]
Mroczka R, Słodkowska A.
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Molecular Biointerface Characterization for an Implanted Medical Device Using Cryogenic Orbitrap Secondary Ion Mass Spectrometry (Cryo-OrbiSIMS). [PDF]
Bin Sabri AH +10 more
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Label-free sub-micrometer 3D imaging of ciprofloxacin in native-state biofilms with cryo-time-of-flight secondary ion mass spectrometry. [PDF]
Akbari A +4 more
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Resolving agrochemical penetration in wheat leaves with secondary ion mass spectrometry imaging and depth profiling. [PDF]
Ajith A +7 more
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Interaction of Bis-(sodium-sulfopropyl)-Disulfide and Polyethylene Glycol on the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry. [PDF]
Mroczka R +3 more
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Computer Vision-Assisted Data Analysis for Correlative Electron Microscopy and Secondary Ion Mass Spectrometry Imaging. [PDF]
du Toit A, Lork AA, Ernst C, Phan NTN.
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Chemical Imaging and Analysis of Single Nerve Cells by Secondary Ion Mass Spectrometry Imaging and Cellular Electrochemistry. [PDF]
Lork AA, Vo KLL, Phan NTN.
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Surface analysis of the size-fractioned urban aerosols by secondary ion mass spectrometry (ToF-SIMS)
Rogowski J., Bem H.
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