Secondary ion mass spectrometry of vapor−liquid−solid grown, Au-catalyzed, Si wires [PDF]
, 2008 Knowledge of the catalyst concentration within vapor-liquid-solid (VLS) grown semiconductor wires is needed in order to assess potential limits to electrical and optical device performance imposed by the VLS growth mechanism.
Atwater, Harry A. +7 more
core +1 more source
Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling
Advanced Engineering Materials, EarlyView.Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer +3 more
wiley +1 more source
Analytical microprobes: getting more out of less [PDF]
, 2017 The arsenal of techniques capable of getting chemical information from reduced spatial domains has been a constant in the analytical instrumentation. Such evolution has run in parallel with the extraordinary advances in the field of microscopy that have ...
Vadillo-Perez, Jose Miguel
core
Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]
, 2013 The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Alexis, Joël +5 more
core +3 more sources
Zein‐Based Adhesives: Sustainable Extraction and Application in Bioadhesive Technologies
Advanced Engineering Materials, EarlyView.Zein is extracted from corn gluten meal using a simple and scalable process with high yield (~90%). The resulting protein is applied in bioadhesives modified with Ca2+ and Fe3+ ions, exhibiting substrate‐dependent adhesion. The findings demonstrate competitive bonding performance and highlight the role of ionic interactions in tuning adhesion ...
Paula Bertolino Sanvezzo +3 more
wiley +1 more source
Boron concentration profiling by high angle annular dark field-scanning transmission electron microscopy in homoepitaxial delta-doped diamond layers [PDF]
, 2013 To develop further diamond related devices, the concentration and spatial location of dopants should be controlled down to the nanometer scale. Scanning transmission electron microscopy using the high angle annular dark field mode is shown to be ...
Alegre Salguero, María de la Paz +5 more
core +4 more sources
Time‐Dependent Oxidation and Scale Evolution of a Wrought Co/Ni‐Based Superalloy
Advanced Engineering Materials, EarlyView.This study shows how a new wrought Co/Ni‐based superalloy resists oxidation at 800 ∘$^\circ$C. The oxide scale changes from rough, fast‐growing spinel to a dense, protective chromia–alumina layer. Atom probe analysis reveals tiny refractory‐rich bubbles at the interface that mark the transition to long‐term, diffusion‐controlled protection ...
Cameron Crabb +6 more
wiley +1 more source
Dynamic NanoSIMS ion imaging of unicellular freshwater algae exposed to copper [PDF]
, 2018 This work demonstrates the capabilities of nanoscale secondary-ion mass spectrometry, using the Cameca NanoSIMS50 ion microprobe, to detect and image the copper-ion distribution in microalgal cells exposed to nanomolar and micromolar copper ...
Eybe, Tanja +4 more
core
PIXE and ToF-SIMS analysis of streaker samplers filters [PDF]
, 2004 This paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous ...
Adriaens, Mieke +9 more
core +2 more sources