Results 291 to 300 of about 3,944,515 (307)
Some of the next articles are maybe not open access.
Spiking in a semiconductor device: Experiments and comparison with a model
Physical Review E, 1996, Niedernostheide +4 more
openaire +2 more sources
A variable temperature test station for extraction of semiconductor device modeling parameters
IEEE Transactions on Instrumentation and Measurement, 1988M H White
exaly
The Monte Carlo method for semiconductor device and process modeling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990exaly
Reliability prediction modeling of semiconductor light emitting device
IEEE Transactions on Device and Materials Reliability, 2003Michael Pecht, Jingsong Xie
exaly
Artificial neural networks for compound semiconductor device modeling and characterization
2017David E Root
exaly
Guest Editorial Special Issue on Semiconductor Device Modeling for Circuit and System Design
IEEE Transactions on Electron DevicesYogesh Singh Chauhan
exaly
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
Siegfried Selberherr
exaly
Siegfried Selberherr
exaly
Optical properties of semiconductor heterostructures for active photonic device modeling
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2000exaly

