Results 291 to 300 of about 3,944,515 (307)
Some of the next articles are maybe not open access.

Spiking in a semiconductor device: Experiments and comparison with a model

Physical Review E, 1996
, Niedernostheide   +4 more
openaire   +2 more sources

A variable temperature test station for extraction of semiconductor device modeling parameters

IEEE Transactions on Instrumentation and Measurement, 1988
M H White
exaly  

The Monte Carlo method for semiconductor device and process modeling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
exaly  

Reliability prediction modeling of semiconductor light emitting device

IEEE Transactions on Device and Materials Reliability, 2003
Michael Pecht, Jingsong Xie
exaly  

Implications of Analytical Investigations About the Semiconductor Equations on Device Modeling Programs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
Siegfried Selberherr
exaly  

Optical properties of semiconductor heterostructures for active photonic device modeling

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2000
exaly  

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