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Semiconductor device capable of increasing reliability
1995SAKAO MASATO, OHYA SHUICHI
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Augmenting semiconductor's devices quality and reliability
2008EREZ NIR, BALOG GIL
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Wafer Test Methods to Improve Semiconductor Die Reliability
IEEE Design and Test of Computers, 2008exaly
Method of testing reliability of semiconductor device
2013LIU XIAOYAN +4 more
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Review on the Thermal Parameters Applications in the Reliability of Power Semiconductor Device
Pengju Sunexaly
Semiconductor reliability within the U. S. department of defense
Proceedings of the IEEE, 1974exaly
Semiconductor device improved in ESD reliability
2003NAKAMURA KAZUTOSHI +2 more
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Simple method of assessing the reliability of semiconductor devices
Microelectronics Reliability, 1986openaire +1 more source