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A Reliable and Economical Test Method for Semiconductor Device Aging
2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 2022Xinhuan Yang +5 more
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Reliability Analysis of the Gradual Degradation of Semiconductor Devices.
1983Abstract : A review of the recent results on accelerated aging of both power and low-noise GaAs FETs indicates that the major failure mode occurs by gradual deterioration and not by the usually (implicity) assumed catastrophic device failure. It is shown that assuming catastrophic degradation when devices actually fail gradually can lead to incorrect ...
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Reliability of semiconductor devices
1959 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1959openaire +1 more source
Testing and reliability of semiconductor devices
Microelectronics Reliability, 1970openaire +2 more sources
The Reliability of Semiconductor Devices: An Overview
Proceedings of the 6th International Conference on Optimization of Electrical and Electronic Equipments, 2005openaire +1 more source
A Reliability Predictor for Semiconductor Devices
Third Annual Symposium on the Physics of Failure in Electronics, 1964openaire +1 more source
Reliability prediction modeling of semiconductor light emitting device
IEEE Transactions on Device and Materials Reliability, 2003Michael Pecht, Jingsong Xie
exaly