Results 261 to 270 of about 2,771,177 (302)

Status of Compound Semiconductor Device Reliability

1990
A review is made of compound semiconductor device reliability from the period 1980 to the present. Emphasis is placed on technology based on field effect transistors (FETs). Many reliability studies were made of small signal GaAs FETs in the 1970s and of GaAs power FETs in the 1980’s; a substantial reliability base exists for these devices.
W. T. Anderson, A. Christou
openaire   +1 more source

Reliability Issue in Compound Semiconductor Heterojunction Devices

1998
The failure mechanisms affecting electron devices based on compound semiconductors are reviewed.
FANTINI F, BORGARINO M, CATTANI L, COVA, Paolo, MENOZZI, Roberto, SALVIATI G, CANALI C, MENEGHESSO G, ZANONI E.   +8 more
openaire   +4 more sources

Reliability of semiconductor devices - The need for simulation

2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2011
Reliability requirements for semiconductor devices have increased tremendously in the past years. However, product qualification is still dominated by standard stress test procedures. Despite improved approaches that have entered the discussion recently, testing alone will not suffice to prove very low failure rates.
openaire   +1 more source

METHOD FOR DETERMINING THE PARAMETRIC RELIABILITY OF SEMICONDUCTOR DEVICES

ВЕСТНИК ВОРОНЕЖСКОГО ГОСУДАРСТВЕННОГО ТЕХНИЧЕСКОГО УНИВЕРСИТЕТА, 2023
Разработку различных электронных устройств невозможно представить в современном мире без использования полупроводниковых элементов. Данные элементы обладают рядом неоспоримых преимуществ и наиболее востребованы в современной электронной промышленности.
openaire   +1 more source

Reliability of semiconductor devices for submarine-cable systems

Proceedings of the IEEE, 1974
The Bell System initiated development of semiconductor devices for use in broad-band repeatered coaxial submarine-cable telephone systems in the early 1960's. Development of such devices has continued at varying levels of activity to this date. Now, over a decade later, more than five years of successful operational life have elapsed on the first ...
openaire   +1 more source

Building reliability monitors for power semiconductor devices

2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486), 2002
Statistical analyses were used to build an efficient reliability monitor for power semiconductor devices. Benefits for the device manufacturing are obtained.
L. Galateanu, C. Tibeica, F. Turtudau
openaire   +1 more source

Reliability of compound semiconductor devices for space applications

Microelectronics Reliability, 1999
Abstract Application of semiconductor devices in high reliability space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices. This paper provides a description of the reliability and qualification issues related to the application of compound semiconductor devices in critical space ...
openaire   +1 more source

Testing for Reliability Qualification of Semiconductor Memory Devices

16th International Reliability Physics Symposium, 1978
This presentation describes the essence of the reliability qualification program and procedures which have evolved since we first started designing semiconductor memory systems in 1970. The goal for the program is to determine and maintain the reliability of the semiconductor memory devices and systems over their whole life.
openaire   +2 more sources

Reliability Testing of Semiconductor Optical Devices

2012
Reliability of semiconductor optical devices used in recent systems and equipment is described from an aspect of the degradation mechanisms observed on various reliability tests. The degradation mechanisms clarified for last three decades still govern the device reliability in recent systems and equipment.
openaire   +1 more source

Reliability issues in high-voltage semiconductor devices

2012
Semiconductor devices are used in many different application areas and play an important role in the modern world. Advances in technology, customer demands, and cost pressure lead to higher integration densities and to smart power structures, which incorporate high- and low-voltage devices on the same chip.
openaire   +1 more source