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Reliability of semiconductor devices for submarine-cable systems
Proceedings of the IEEE, 1974The Bell System initiated development of semiconductor devices for use in broad-band repeatered coaxial submarine-cable telephone systems in the early 1960's. Development of such devices has continued at varying levels of activity to this date. Now, over a decade later, more than five years of successful operational life have elapsed on the first ...
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Reliability of wide bandgap semiconductor power switching devices
Proceedings of the IEEE 2010 National Aerospace & Electronics Conference, 2010Long-term field-reliability of gallium nitride (GaN) and silicon carbide (SiC) power switching devices is critically discussed in terms of bulk material defects. A new static reverse bias stress test circuit with a reactive load is proposed to delineate devices prone to field-failures.
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Testing and reliability of semiconductor devices
Microelectronics Reliability, 1970openaire +2 more sources
Reliability of semiconductor devices
1959 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1959openaire +1 more source
Nanoscale semiconductor devices for reliable robotic systems
2020Balwant Raj +2 more
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A Reliability Predictor for Semiconductor Devices
Third Annual Symposium on the Physics of Failure in Electronics, 1964openaire +1 more source
The Reliability of Semiconductor Devices: An Overview
Proceedings of the 6th International Conference on Optimization of Electrical and Electronic Equipments, 2005openaire +1 more source