Results 111 to 120 of about 372,122 (281)

Wide Response Range Photoelectrochemical UV Detector Based on Anodized TiO₂-Nanotubes@Ti@quartz Structure

Nanomaterials
Conventional sandwich structure photoelectrochemical UV detectors cannot detect UV light below 300 nm due to UV filtering problems. In this work, we propose to place the electron collector inside the active material, thus avoiding the effect of ...
Youqing Wang, Miaomiao Zhang, Wenxuan Wu, Ze Wang, Minghui Liu, Tiantian Yang, Renqianzhuoma   +6 more
doaj   +1 more source

Polarographic carbon dioxide transducer amplifier [PDF]

, 1971
Electronic amplifier contains matched pair of metal oxide semiconductor field effect transistor devices which have high input impedance and long-term stability.
Stillman, G.
core   +1 more source

Optoelectronic Synaptic Devices Using Molecular Telluride Phase‐Change Inks for Three‐Factor Learning

Advanced Functional Materials, EarlyView.
Optoelectronic synaptic devices based on solution‐processed molecular telluride GST‐225 phase‐change inks are demonstrated for three‐factor learning. A global optical signal broadcast through a silicon waveguide induces non‐volatile conductance updates exclusively in locally electrically flagged memristors.
Kevin Portner, Dhananjeya Kumaar, Giacomo Torti, Killian Keller, Till Zellweger, Florian M. Schenk, Christoph Weilenmann, Daniel Chelladurai, Vara Prasad Jonnalagadda, Ghazi Sarwat Syed, Vanessa Wood, Jürg Leuthold, Alexandros Emboras, Maksym Yarema, Mathieu Luisier   +14 more
wiley   +1 more source

A semi-empirical approach to calibrate simulation models for semiconductor devices. [PDF]

Sci Rep, 2023
Jaiswal R, Martínez-Ramón M, Busani T.
europepmc   +1 more source

Complexation‐Mediated Diffusion‐Limited Crystal Growth: A General Framework for Anisotropic Crystal Growth in Cu‐Based Perovskites

Advanced Functional Materials, EarlyView.
A Complexation‐Mediated Diffusion‐Limited Growth (CMDLG) framework is established to rationalize the anisotropic growth of lead‐free perovskites. Integrating coordination chemistry with mass transport kinetics, this study theoretically derives and experimentally validates that stable iodocuprate complexes induce a diffusion‐limited regime.
Hyunmin Lee, Mu Geun Son, Thanh Van Vu, Hokyeong Jeong, Joonhee Kang, Youngjong Kang   +5 more
wiley   +1 more source

Artifact‐Minimizing Ultrathin Transparent Electrodes Fabricated via iCVD for In Vivo Optogenetic Stimulation and Neural Signal Monitoring of Primary Visual Cortex

Advanced Functional Materials, EarlyView.
We present ultrathin flexible transparent electrodes through iCVD‐enabled molecular control of 10 nm gold films on poly(dimethylaminomethylstyrene). In vivo validation demonstrated photoelectric artifact reduction vs. opaque electrodes and preservation of natural neural dynamics.
Tae Jin Mun, Minju Kim, Chaesung Kim, Yunyoung Choi, In‐Yeop Baek, Younghak Cho, Gyeongyong Lee, Yerim Jang, Min‐Ho Nam, Wonryung Lee, Maesoon Im, Hyejeong Seong   +11 more
wiley   +1 more source

Interfacial Delamination at Multilayer Thin Films in Semiconductor Devices. [PDF]

ACS Omega, 2022
Kim JH, Kil HJ, Lee S, Park J, Park JW.
europepmc   +1 more source

Charge and spin state readout of a double quantum dot coupled to a resonator

, 2010
State readout is a key requirement for a quantum computer. For semiconductor-based qubit devices it is usually accomplished using a separate mesoscopic electrometer.
Anderson, D., Atkinson, P., Jones, G. A. C., Petersson, K. D., Ritchie, D. A., Smith, C. G.   +5 more
core   +1 more source

Uncovering the Origin of Efficiency Roll‐Off in TADF OLEDs

Advanced Functional Materials, EarlyView.
OLEDs based on thermally activated delayed fluorescent (TADF) materials often suffer from a severe drop in efficiency at high brightness levels. This work presents a technique to uncover the source of this efficiency drop, and quantifies the exciton‐exciton and exciton‐polaron annihilation processes responsible for efficiency losses in our TADF OLEDs ...
Liam G. King, Kou Yoshida, Arvydas Ruseckas, Ifor D. W. Samuel   +3 more
wiley   +1 more source

Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devices. [PDF]

Light Sci Appl, 2022
Kwon S, Park J, Kim K, Cho Y, Lee M.
europepmc   +1 more source