Results 171 to 180 of about 27,403 (301)
Noise characteristics of semiconductor lasers with narrow linewidth. [PDF]
Wang H +13 more
europepmc +1 more source
Graphene-Coupled Terahertz Semiconductor Lasers for Enhanced Passive Frequency Comb Operation. [PDF]
Li H +12 more
europepmc +1 more source
Large size (∼100 µm) monolayer MoS2 grown by LPI‐CVD on n‐GaN exhibit a high n‐type doping, very low strain, and a type‐I band alignment at MoS2/GaN interface. Photocurrent measurements under illumination with photon energies from ∼2 to ∼5 eV show superior electro‐optical performances of these MoS2/n‐GaN heterojunctions as compared to Ni/n‐GaN devices ...
Salvatore Ethan Panasci +12 more
wiley +1 more source
Surface State Passivation and Optical Properties Investigation of GaSb via Nitrogen Plasma Treatment
Xuan Fang +11 more
doaj +1 more source
Generation of optical frequency combs in optically injected integrated gain-switched semiconductor lasers and their applications in Doppler LIDAR. [PDF]
Zhang Y +9 more
europepmc +1 more source
Quantum control of phase fluctuations in semiconductor lasers. [PDF]
Santis CT +4 more
europepmc +1 more source
Stochastic resonance in quantum-well semiconductor lasers
The quantum well (QW) semiconductor lasers have become main optical sources for optical fibre communication systems because of their higher modulation speed, broader modulation bandwidth and better temperature characteristics.
Cao L +5 more
core
Mechanical Stress Evolution in Polycrystalline Ge Thin Films Under MeV Ion Irradiation
Irradiation of polycrystalline Ge thin films with 1.8 MeV Au ions alters residual stress through defect generation and lattice expansion. Increasing fluence drives progressive lattice disorder and eventual amorphization. Polycrystalline Ge resists amorphization longer than crystalline Ge, as grain boundaries facilitate defect diffusion, significantly ...
Karla J. Paz Corrales +10 more
wiley +1 more source
EA-Directing Formamidinium-Based Perovskite Microwires with A‑Site Doping
Shan Xu +7 more
doaj +1 more source
This study establishes a dual‐channel optical metrology framework integrating phase‐shifting imaging ellipsometry and deep‐UV reflectance imaging. This label‐free approach enables simultaneous, time‐resolved mapping of film thickness and nanoparticle (NP) concentration in dynamic nanofluid thin films.
Eita Shoji +3 more
wiley +1 more source

