Results 121 to 130 of about 10,590,427 (302)

Experimental study of 600V GaN transistor under the short-circuit aging tests

open access: yes, 2018
International audienceThis paper presents experimental short-circuit aging tests of a 600V GaN (Gallium nitrite) GIT (Gate Injection Transistor). The short circuit aging tests effect under the drain voltage of 35 V and the two short-circuit durations (1 ...
Kadi, M.   +7 more
core   +1 more source

Disentangling Bulk and Surface Contributions to Charge and Discharge Fading in High‐Voltage LiCoO2

open access: yesAdvanced Functional Materials, EarlyView.
High‐voltage operation of LiCoO2 accelerates capacity fading through bulk and surface degradation. By introducing a LiTaO3 coating to selectively suppress surface degradation, bulk and surface contributions to charge and discharge fading are decoupled.
Hyungjoon Moon   +6 more
wiley   +1 more source

A New Method of Transformer Short-Circuit Impedance Regulation Based on Magnetic Shunts

open access: yesEnergies
Short-circuit impedance is an important economic and technical index to test the cost, efficiency and operation safety of transformers. Increasing the short-circuit impedance of the transformer can reduce the influence of the transformer fault current on
Zhijun Ye, Hao Jia, Wei Cai, Wenhui Zeng
doaj   +1 more source

Memristive‐Gated RC‐Delay Synaptic Transistors for Time‐Encoded Analog in‐Memory Computing

open access: yesAdvanced Functional Materials, EarlyView.
A Memristive‐Gated Transistor for Time‐Encoded Analog In‐Memory Computing — By exploiting the RC delay of a self‐rectifying interface‐type memristor, nonlinear I–V distortion is structurally bypassed, enabling 3‐bit nonvolatile memory, spike‐timing‐based analog encoding, and hardware‐calibrated reservoir‐computing validation within a unified device ...
Yun‐Seo Shin   +7 more
wiley   +1 more source

A test chip for a novel high-dynamic-range CMOS image sensor

open access: yes, 2001
We report on the design of a CMOS image sensor, featuring a novel active pixel architecture which allows for a very high dynamic range by adapting the single pixel integration time to the local illumination conditions.
Gonzo, Lorenzo   +5 more
core  

Dynamically Actuated Reconfigurable Topographical Surface Enables Active Control of Implant‐Associated Infections

open access: yesAdvanced Functional Materials, EarlyView.
A dynamically actuated reconfigurable topographical surface (DARTS) integrates contact‐mediated bactericidal nanotopography with programmable mechanical actuation to actively disrupt bacterial biofilms. Dynamic surface reconfiguration enhances bacterial killing and suppresses implant‐associated infections in vivo, providing a new strategy for active ...
Mohammad Asadi Tokmedash   +4 more
wiley   +1 more source

Gradient‐Conductivity Architecture Enables Synchronous Enhancement of Sensitivity and Detection Range in Multifunctional All‐Paper Sensors

open access: yesAdvanced Functional Materials, EarlyView.
A gradient‐engineered all‐paper sensor is fabricated by integrating MXene and in situ grown AgNPs within hierarchical cellulose networks. The device breaks the sensitivity–detection range trade‐off through cascaded conductive pathways, enabling ultrahigh pressure sensitivity, humidity–pressure decoupled dual‐mode sensing, and outstanding EMI shielding,
Ao Li   +7 more
wiley   +1 more source

Emerging Post‐CMOS Hardware Neurons for Brain‐Inspired Computing: Devices, Circuits, and System Integration

open access: yesAdvanced Functional Materials, EarlyView.
The physical realization of artificial neurons is a critical challenge for energy‐efficient neuromorphic computing. This review presents a comprehensive analysis of the evolution of artificial neuron implementations from conventional CMOS to emerging post‐CMOS technologies.
Kannan Udaya Mohanan   +4 more
wiley   +1 more source

Study on the dynamic mechanical properties of winding‐block axial structure considering short circuit strain rate effect

open access: yesHigh Voltage
Transformers may suffer multiple short‐circuit impacts during long‐term operation, and axial instability is one of the typical types of serious accidents caused by short‐circuit faults.
Xinyu Wang   +5 more
doaj   +1 more source

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