Results 131 to 140 of about 332,485 (313)

A test chip for a novel high-dynamic-range CMOS image sensor

, 2001
We report on the design of a CMOS image sensor, featuring a novel active pixel architecture which allows for a very high dynamic range by adapting the single pixel integration time to the local illumination conditions.
Gonzo, Lorenzo, Gottardi, Massimo, Simoni, Andrea, Gemma Hornero, Dalla Betta, Gian Franco, Stoppa, David   +5 more
core  

Advances in Sustainable and Wearable Textile Based Soft Robotics

Advanced Functional Materials, EarlyView.
This Review examines advances in wearable textile‐based soft robotics, focusing on sustainable materials, integrated sensing, and scalable actuation. It discusses manufacturing and system integration across healthcare, assistive robotics, prosthetics, and human–machine interfaces, and highlights key challenges in circular design, including life‐cycle ...
Zahir Abbas, Marzia Dulal, Sophia K. Novoselov, Victoria K. Novoselov, Kostya S. Novoselov, Shaila Afroj, Nazmul Karim   +6 more
wiley   +1 more source

Study on the dynamic mechanical properties of winding‐block axial structure considering short circuit strain rate effect

High Voltage
Transformers may suffer multiple short‐circuit impacts during long‐term operation, and axial instability is one of the typical types of serious accidents caused by short‐circuit faults.
Xinyu Wang, Ping Wang, Jianghai Geng, Zikang Zhang, Fangcheng Lü, Shuguo Gao   +5 more
doaj   +1 more source

Short-Circuit Testing Station [PDF]

Nature, 1934
openaire   +1 more source

Thermally Pre‐Formed Reconfigurable Resistive Random‐Access Memory Crossbar Arrays: A Dual‐Mode Platform for Robust Physically Unclonable Functions and In‐Memory Computing

Advanced Functional Materials, EarlyView.
A reconfigurable RRAM platform utilizing thermally pre‐formed filaments (TPFs) is developed to realize robust hardware security. By exploiting the thermodynamic stochasticity of TPFs, exceptionally reliable physically unclonable functions (PUFs) are achieved.
Seongbin Kwon, Taewon Lee, Dohyeong Kim, Sungmin Hwang, Sungjoon Kim   +4 more
wiley   +1 more source

Dynamic Voltage Scaling Aware Delay Fault Testing

, 2006
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults.
Zain Ali, Noohul Basheer, Harrod, Peter, Al-Hashimi, Bashir M, Zwolinski, Mark   +3 more
core  

Bandgap‐Engineered AlGaAs/GaAs Heterostructures for Wavelength‐Selective Dual‐Polarity Photoelectrochemistry

Advanced Functional Materials, EarlyView.
Bandgap‐engineered AlGaAs/GaAs heterostructures exhibit wavelength‐selective dual‐polarity photoelectrochemistry, switching from photocathodic to photoanodic response depending on excitation wavelength. The polarity transition is governed by band‐selective absorption, built‐in electric‐field‐driven carrier transport, and interfacial charge‐transfer ...
Yukai Mao, Lipin Chen, Jules Courtin, Siyu Lin, Gangri Cai, Yan Zhu, Yoan Léger, Nicolas Bertru, Jinshi Zhao, Charles Cornet   +9 more
wiley   +1 more source

Short-Circuit Testing Stations [PDF]

Nature, 1938
openaire   +1 more source

Coupling Anodic Activity and Stability at Ni‐Based Non‐Oxide Catalysts via Coordinating Alcohol Oxidation and Oxygen Evolution

Advanced Functional Materials, EarlyView.
A cooperative and competitive interrelationship between alcohol oxidation (AOR) and water oxidation (OER) was observed on a typical anode catalyst of Ni2P. In situ Raman spectroscopy and electrochemical analyses revealed a specific complementary mechanism between them, in which OER and AOR critically contribute to the activity and stability of anodic ...
Yong Yan, Xinyu Liu, Yuguo Zhao, Hanwen Jian, Huan Zhou, Riyi Zhang, Dong Wang, Peter Schaaf, Lihua Wang, Guangsheng Guo, Xiayan Wang   +10 more
wiley   +1 more source

Short- circuit tests of circuit breakers

This paper deals with short-circuit tests of low voltage electrical devices. In the first part of this paper, there are described basic types of short- circuit tests and their principles.
Chorovský, P.
core   +1 more source