A Comprehensive Analysis of Short-Circuit Fault in Wound-Rotor Resolvers
IEEE Transactions on Vehicular Technology, 2020This paper presents a detailed analysis of short circuit fault (SCF) in wound rotor (WR) resolvers. For this purpose, an analytical model based on winding function (WF) method is developed considering the stator and rotor windings’ fault, the severity of the fault, the phase of the stator faulty winding, and the tooth of shorted turns.
Hamed Lasjerdi, Zahra Nasiri-Gheidari
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Test calculation for logic and short-circuit faults in digital circuits
2012 IEEE 16th International Conference on Intelligent Engineering Systems (INES), 2012In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included.
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Short circuit faults in state-of-the-art ADCs - are they hard or soft?
Proceedings 10th Asian Test Symposium, 2002For next generation deep sub-micron (DSM) analogue and mixed signal ICs, the integration of Design-for-Test (DfT), Design for-Manufacturability (DfM), Defect-Oriented Test (DOT) approaches, and Built-In Self-Test (BIST) techniques into the design and manufacturing cycle will gain increasing importance to the context of implementing a structural IC test
Andreas Lechner +2 more
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A discussion on IGBT short-circuit behavior and fault protection schemes
IEEE Transactions on Industry Applications, 1995IGBTs are available with short-circuit withstand times approaching those of bipolar transistors. These IGBTs can therefore be protected by the same relatively slow-acting circuitry. The more efficient IGBTs, however, have lower short-circuit withstand times.
R. Chokhawala, J. Catt, L. Kiraly
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Hierarchical Agglomerative Clustering of Short-Circuit Faults in Transmission Lines
2008 10th Brazilian Symposium on Neural Networks, 2008Data mining can play a fundamental role in modern power systems. However, a major problem is to extract useful information from the currently available non-labeled digitized time series. This work proposes a new methodology based on hierarchical clustering for labeling faults that occurred in transmission lines.
Claudomir Cardoso +3 more
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Test Generation for Short-Circuit Faults in Digital Circuits
2014In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included.
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Synchronous Generator Short-Circuit and System Faults
1975Although the majority of the faults occurring in practice on a power system are unsymmetrical between the phases, the symmetrical fault is important because, although rarer, it is more severe. It is, moreover, a simpler condition to analyse, and therefore forms a suitable starting-point for a study of fault conditions.
Bernard Adkins, Ronald G. Harley
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Analysis of Fault Recorder Data for Short-Circuit Current in a 500kV Busbar Short-Circuit Accident
Advanced Materials Research, 2011The three-phase short-circuit fault of the 500 kV busbar of Waigaoqiao No.2 Power Plant was described, and the fault recorder data was analyzed for short-circuit current. The RMS of short-circuit current decaying fundamental frequency component, DC component and the attenuation time constant was obtained by Fourier transform, extrapolating with the ...
Wei Cao +3 more
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Remedial operations for open- and short-circuit faults of permanent magnet fault tolerant motor
2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE), 2015Due to their concentrated windings and modular topology, permanent-magnet fault-tolerant (PMFT) motors inherently offer decoupling phases and fault-tolerant capability. According to open- and short-circuit faults, and in order to keep torque performance invariant during the faulty operation, two relevant fault tolerant strategies are separately ...
Binqiang Si +3 more
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A new gate circuit performing fault protections of IGBTs during short circuit transients
Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344), 2003Short circuit faults of IGBTs determine overcurrent through the devices subsequently to a turn-on switching or during the on-state condition, leading respectively to hard switching fault (HSF) or fault under load (FUL). Firstly, the state of the art as appearing in literature is recalled and discussed.
BELVERDE G +4 more
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