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Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, 2012
A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee +2 more
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A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee +2 more
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Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285), 2003
Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Larry Wissel +4 more
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Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Larry Wissel +4 more
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2021
Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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Soft errors: is the concern for soft-errors overblown?
IEEE International Conference on Test, 2005., 2005Cosmic ray particles have the ability to either toggle the state of memory elements or create unwanted glitches in combinational logic that may be latched by memory elements. As supply voltages reduce and feature sizes become smaller in future technologies, soft error tolerance is considered a significant challenge for designing future electronic ...
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Is the concern for soft-error overblown?
IEEE International Conference on Test, 2005., 2005This article gives a general perspective regarding soft error and how to deal with it. Finally it the author gives his position on issues in solving soft error problems.
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CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
Journal of Electronic Testing, 2013Due to the continuous technology scaling, soft error becomes a major reliability issue at nanoscale technologies. Single or multiple event transients at low levels can result in multiple correlated bit flips at logic or higher abstraction levels. Addressing this correlation is essential for accurate low-level soft error rate estimation, and more ...
Chen, L., Ebrahimi, M., Tahoori, M. B.
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12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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2020
Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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A dynamic approach to tolerate soft errors
Cluster Computing, 2012Dynamic implementation for software-based soft error tolerance method which can protect more types of codes can cover more soft errors. This paper explores soft error tolerance with dynamic software-based method. We propose a new dynamic software-based approach to tolerate soft errors.
Lei Xiong, Qingping Tan
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