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The concern for soft errors is not overblown

IEEE International Conference on Test, 2005., 2006
Single event upsets in logic paths are an emerging concern for computing systems built in advanced CMOS technologies. Upset rates for latches used in sequential circuits are increasing, and combinatorial circuit elements will also become a factor for future technology nodes.
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Modeling the Propagation of Soft Errors in Programs

Proceedings of the 2nd International Conference on Computer Science and Software Engineering, 2019
Due to the continuous growth of transistors in processors, the cloud computing paradigm and increasingly complex environment, soft errors, which are a category of typical transient errors, have become an urgent challenge in ground-level systems. To handle these errors, making clear the error propagation is the key step.
Lixing Xue, Zhan Zhang, Decheng Zou
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Enhancing I2C robustness to soft errors

2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 2017
This paper proposes the use of a I2C Bus Monitor core able to perform data integrity verification activities, to signalize metrics about the quality of communications, to detect transient faults and permanent errors on the bus and to act on the devices connected to the bus for the recovery of such errors avoiding failures.
Vicente Carvalho   +1 more
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On Soft Error Immunity of Sequential Circuits

2010 19th IEEE Asian Test Symposium, 2010
With technology scaling, radiation-induced soft error has been a major concern even for mainstream enterprise applications. Since various hardening solutions impose significant costs in performance, area and power consumption, full soft error protection can hardly satisfy the multiple design goals simultaneously.
Dan Zhu, Tun Li, Sikun Li
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Soft Error Tolerant BILBO FF

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010
This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF.
Kazuteru Namba, Hideo Ito
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SIMD-based soft error detection

Proceedings of the ACM International Conference on Computing Frontiers, 2016
Soft error rates in processors have been increasing with decreasing feature size and larger chips. Software-only solutions have been proposed to deal with this problem, for instance via instruction duplication. However, this leads to significant overheads in performance and energy.
Zhi Chen 0001   +2 more
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Soft Error Mitigation in Soft-Core Processors

2016
This chapter aims to present different approaches and techniques available in literature regarding the fault mitigation on soft-core processors, with an especial emphasis on those ones involving hardware/software hybrid-based solutions.
Antonio Martínez-Álvarez   +2 more
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Managing Soft-Errors in Transactional Systems

2014 IEEE International Parallel & Distributed Processing Symposium Workshops, 2014
Multicore architectures are becoming increasingly prone to soft-errors – i.e., transient faults caused by external physical phenomena such as electric noise and cosmic particle strikes. With increasing core counts, the soft-error rate is growing due to the accelerating transistor density on chips.
Mohamed Mohamedin   +2 more
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Effects of Soft Error to System Reliability

2011 IEEE Workshops of International Conference on Advanced Information Networking and Applications, 2011
Soft errors on hardware could affect the reliability of computer system. To estimate system reliability, it is important to know the effects of soft errors to system reliability. This paper explores the effects of soft errors to computer system reliability. We propose a new approach to measure system reliability for soft error factor.
Lei Xiong, Qingping Tan, Jianjun Xu
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An Experimental Study of Soft Errors in Microprocessors

IEEE Micro, 2005
The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor.
Giacinto Paolo Saggese   +4 more
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