Results 101 to 110 of about 1,809,083 (306)

Memristive‐Gated RC‐Delay Synaptic Transistors for Time‐Encoded Analog in‐Memory Computing

open access: yesAdvanced Functional Materials, EarlyView.
A Memristive‐Gated Transistor for Time‐Encoded Analog In‐Memory Computing — By exploiting the RC delay of a self‐rectifying interface‐type memristor, nonlinear I–V distortion is structurally bypassed, enabling 3‐bit nonvolatile memory, spike‐timing‐based analog encoding, and hardware‐calibrated reservoir‐computing validation within a unified device ...
Yun‐Seo Shin   +7 more
wiley   +1 more source

FAULT INJECTION IN DYNAMIC PARTIAL RECONFIGURATION DESIGN BASED ON ESSENTIAL BITS

open access: yesHavacılık ve Uzay Teknolojileri Dergisi, 2018
SEU or soft error is an unintended change to the state of a configuration memory bit caused by ionizing radiation which causes unacceptable changes in the design behavior.
Mohamed Elhady Magdy Keshk   +1 more
doaj  

FRESH: Fully Reliable and Effective Protection Against Soft and Hard Errors

open access: yesIEEE Access
Advances in modern computing systems have led to an unprecedented spread of safety-critical applications in real-world environments. In safety-critical applications, preventing malfunctions due to faults is a primary design concern, as malfunctions in ...
Daehoon Son   +5 more
doaj   +1 more source

A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs

open access: yesAdvances in Electrical and Computer Engineering, 2013
The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level.
KIM, J. T., PARK, J. K.
doaj   +1 more source

Impact of Soft Errors in a Brake-by-Wire System

open access: yes, 2007
This paper presents an experimental evaluation of the impact of soft errors in a brake-by-wire system for road vehicles. Our goal is to assess the risk that soft errors will cause the brake system to produce undetected dangerous outputs.
Skarin, Daniel,   +2 more
core  

Online monitoring soft errors in reconfigurable FPGA during radiation test

open access: yes, 2017
Due to rapid technology scaling, electronic devices are becoming more susceptible against soft errors induced by radiation particles, which is a serious challenge for aerospace applications.
Sterpone, Luca   +3 more
core   +1 more source

Emerging Post‐CMOS Hardware Neurons for Brain‐Inspired Computing: Devices, Circuits, and System Integration

open access: yesAdvanced Functional Materials, EarlyView.
The physical realization of artificial neurons is a critical challenge for energy‐efficient neuromorphic computing. This review presents a comprehensive analysis of the evolution of artificial neuron implementations from conventional CMOS to emerging post‐CMOS technologies.
Kannan Udaya Mohanan   +4 more
wiley   +1 more source

Bio‐Inspired Artificial Ionic Mechanoreceptor

open access: yesAdvanced Functional Materials, EarlyView.
A skin‐inspired artificial mechanoreceptor based on ionic interactions is presented for biomimetic tactile sensing. Pressure‐driven ionic redistribution within microfluidic channels generates a self‐powered electrical signal without external bias. The generated waveform exhibits mechanoreceptor‐like temporal features, including overshoot and undershoot,
Mohammad Akbari   +4 more
wiley   +1 more source

Inter- and Intra-Observer Errors in Identifying the Transepicondylar Axis and Whiteside's Line

open access: yesJournal of Orthopaedic Surgery, 2008
Purpose. To assess inter- and intra-observer errors in identifying the transepicondylar axis and Whiteside's line in a cadaveric model mimicking total knee arthroplasty. Methods. Four cadaveric knees with intact soft tissues were used.
CH Yan   +5 more
doaj   +1 more source

Compiler-guided register reliability improvement against soft errors

open access: yes, 2005
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely used in reliability-sensitive environments, it becomes increasingly ...
Wei Zhang, Jun Yan
core   +1 more source

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