Results 101 to 110 of about 139,876 (307)

Low Complexity Syndrome-Based Decoding Algorithm Applied to Block Turbo Codes

IEEE Access, 2018
This paper presents a technique for reducing the decoding complexity of block turbo code with an extended Hamming code as a component code. In conventional decoding algorithms, when an input vector has a zero syndrome, complexity can be reduced by using ...
Byungkyu Ahn, Sungsik Yoon, Jun Heo
doaj   +1 more source

On Soft Error Reliability of Virtualization Infrastructure

IEEE Transactions on Computers, 2016
Hardware errors are no longer exceptions in modern cloud data centers. Although virtualization provides software failure isolation among different virtual machines (VM), the virtualization infrastructure including the hypervisor and privileged VMs remains vulnerable to hardware errors.
Xin Xu, H. Howie Huang
openaire   +1 more source

Template‐Confined Synthesis of Shape‐Engineered Single‐Crystal Gold Microplates in Lithographically‐Defined Polymeric Patterns

Advanced Functional Materials, EarlyView.
Single‐crystal gold microplates are high‐performance nanomaterials with an impressive wafer‐based application space. Progress has, however, been tempered by an inability to exert synthetic control over microplate size, shape, and positioning. In this work, control over these parameters is demonstrated using a seed‐mediated synthesis that both confines ...
Debasish Panda, Md Rashed Nizam, Walker J. Tuff, Collin C. Wyant, Maksym Zhukovskyi, Matthew R. Rosenberger, Botond Sánta, Edward C. Kinzel, Robert A. Hughes, Svetlana Neretina   +9 more
wiley   +1 more source

SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications

IEEE Access
The Ternary Content Addressable Memory (TCAM) is a crucial component of satellite communication systems. Space-oriented TCAMs face unique challenges, as they must operate within a very limited energy budget and are susceptible to high Soft Error Rates ...
Itay Merlin, Benjamin Zambrano, Marco Lanuzza, Alexander Fish, Avner Haran, Leonid Yavits   +5 more
doaj   +1 more source

Research and Evaluation on SEM-based FPGA Anti-SEU Solution

Yuanzineng kexue jishu, 2022
With the development of aerospace avionics, there is an increasing demand for high performance chips to handle data processing and transmission requirements.
SUN Yifan;BAI Liang;SHUANG Xiaochuan;TIAN Wenbo;YOU Hongjun
doaj  

Glissile Interphase Boundaries Enable Collective Phase Switching in Epitaxial Polar Oxides

Advanced Functional Materials, EarlyView.
A triple point is identified in the phase diagram of low‐symmetry epitaxial BiFeO3 thin film along with an extended regime of phase competition associated with a flattened energy landscape. The electromechanical response is shown to be governed by correlated interphase‐boundary motion, including scale‐free avalanche dynamics characteristic of systems ...
Mohammad Moein Seyfouri, Oliver Paull, Ralph Bulanadi, Yasuhiro Sakamoto, Shintaro Yasui, Mikayla Lord, Mahak Chhabra, David Walker, Patrycja Paruch, Shery Chang, Nagarajan Valanoor, Daniel Sando   +11 more
wiley   +1 more source

Tag Replication and Status Bits Encoding for Enhancing Cache Metadata Reliability

Journal of Electrical and Computer Engineering
On-chip caches occupy a significant portion of modern processors, making them increasingly vulnerable to soft errors as technology scales. While data arrays often receive robust protection via error-correcting codes (ECCs), metadata elements such as tag ...
Abdulaziz Tabbakh
doaj   +1 more source

Blood Biomarkers and Surface‐Enhanced Raman Spectroscopy for Gout: A Comprehensive Review

Advanced Functional Materials, EarlyView.
Schematic illustrating gout disease progression from asymptomatic hyperuricemia to chronic tophaceous disease, highlighting the limitations of conventional imaging and biochemical diagnostics and the potential of engineered SERS platforms for ultrasensitive blood‐based detection of urate‐related biomarkers across disease stages, with the color gradient
Isuri Perera, Chiranjeevi Kanike, Appurva Tiwari, Hongyan Wu, Larry D. Unsworth, Ben Bin Xu, Xuehua Zhang   +6 more
wiley   +1 more source

Terrestrial neutron-induced soft errors in advanced memory devices

, 2008
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of ...
Yahagi, Yasuo, Baba, Mamoru, Kameyama, Hideaki, Ibe, Eishi, Nakamura, Takashi   +4 more
core  

A case for acoustic wave detectors for soft-errors

, 2016
The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors.
Upasani, Gaurang, González Colás, Antonio María, Vera Rivera, Francisco Javier   +2 more
core   +1 more source