Results 1 to 10 of about 226,235 (165)
A Novel Low-Power and Soft Error Recovery 10T SRAM Cell [PDF]
Micromachines, 2023 In SRAM cells, as the size of transistors and the distance between transistors decrease rapidly, the critical charge of the sensitive node decreases, making SRAM cells more susceptible to soft errors.
Changjun Liu, Hongxia Liu, Jianye Yang
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A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays [PDF]
SensorsAerospace-grade SRAM-based field-programmable gate arrays (FPGAs) used in space applications are highly susceptible to single event effects, leading to soft errors in FPGAs.
Weihang Wang +4 more
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In-Pipeline Processor Protection against Soft Errors
Journal of Low Power Electronics and Applications, 2023 The shrinking of technology nodes allows higher performance, but susceptibility to soft errors increases. The protection has been implemented mainly by lockstep or hardened process techniques, which results in a lower frequency, a larger area, and higher
Ján Mach +2 more
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IEEE Access, 2022 This study analyzes the effects of the punch-through stop (PTS) layer and well depth in a bulk FinFET SRAM cell on the fraction of charge generated by an ion impact that is collected by the FinFET channel.
Antonio Calomarde +3 more
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Soft Error Resilience of Deep Residual Networks for Object Recognition
IEEE Access, 2020 Convolutional Neural Networks (CNNs) have truly gained attention in object recognition and object classification in particular. When being implemented on Graphics Processing Units (GPUs), deeper networks are more accurate than shallow ones.
Younis Ibrahim +6 more
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Design of Novel and Low Cost Triple-node Upset Self-recoverable Latch
Yuanzineng kexue jishu, 2023 With the development of semiconductor technology, the size of transistors continues to shrink. In complex radiation environments in aerospace and other fields, small-sized circuits are more prone to soft error (SE).
BAI Na1,2;MING Tianbo1;XU Yaohua1;WANG Yi1,3;LI Yunfei1,3;LI Li2,3
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Active Radiation-Hardening Strategy in Bulk FinFETs
IEEE Access, 2020 In this article, we present a new method to mitigate the effect of the charge collected by trigate FinFET devices after an ionizing particle impact. The method is based on the creation of an internal structure that generates an electrical field that ...
Antonio Calomarde +3 more
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A new low power high reliability flip-flop robust against process variations [PDF]
Journal of Electrical and Computer Engineering Innovations, 2016 Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits.
S. Yousefian Langroudi, R. Niaraki Asli
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Understanding soft errors in uncore components [PDF]
Proceedings of the 52nd Annual Design Automation Conference, 2015 The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors.
Hyungmin Cho +3 more
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A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems
Sensors, 2019 For stable and effective control of the sensor system, analog sensor signals such as temperature, pressure, and electromagnetic fields should be accurately measured and converted to digital bits.
Duckhoon Ro +4 more
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