Results 21 to 30 of about 227,778 (263)
Identify Silent Data Corruption Vulnerable Instructions Using SVM
IEEE Access, 2019 Silent data corruption (SDC) is the most insidious and harmful result type of soft error. Identify program vulnerable instructions (PVIns) that are likely to cause SDCs is extremely significant on selective software-based protection techniques.
Na Yang, Yun Wang
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A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs
Advances in Electrical and Computer Engineering, 2013 The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level.
KIM, J. T., PARK, J. K.
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A Methodology to Assess Output Vulnerability Factors for Detecting Silent Data Corruption
IEEE Access, 2019 As process technology scales, electronic devices become more susceptible to soft error induced by radiation. Silent data corruption (SDC) is considered the most severe outcome incurred by soft error.
Junchi Ma, Zongtao Duan, Lei Tang
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MicromachinesWith the rapid development of semiconductor technology, the reduction in device operating voltage and threshold voltage has made integrated circuits more susceptible to the effects of particle radiation. Moreover, as process sizes decrease, the impact of
Rui Dong +6 more
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Soft Error Characterization on Scientific Applications
2018 IEEE 16th Intl Conf on Dependable, Autonomic and Secure Computing, 16th Intl Conf on Pervasive Intelligence and Computing, 4th Intl Conf on Big Data Intelligence and Computing and Cyber Science and Technology Congress(DASC/PiCom/DataCom/CyberSciTech), 2018 Decreasing transistor sizes, aggressive power optimization techniques and higher operation frequencies lead to increase error rates. While researchers addressed reliable computing, there is still lack of study for providing the fundamental understanding of error propagation. In this work, we characterize error propagation at software level by utilizing
Zuhal Ozturk +3 more
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IEEE Access, 2019 This paper presents two novel quadruple cross-coupled memory cell designs, namely QCCM10T and QCCM12T, with protection against single event upsets (SEUs) and double-node upsets (DNUs).
Aibin Yan +6 more
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CRC-Aided Fixed Complexity Error Pattern Estimation Technique
IEEE Access, 2022 Various techniques using cyclic redundancy check (CRC) codes for error correction have been proposed. In previous techniques, a small number of unreliable bits in a packet were toggled in order to change negative acknowledgement (NAK) into ...
Juhee Yun, Nulibyul Kim, Jaekwon Kim
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Pediatric Blood &Cancer, EarlyView.ABSTRACT Ewing sarcoma (ES) and rhabdomyosarcoma (RMS) are aggressive malignancies in children and adolescents where metastases impact prognosis. 18F‐fluoro‐2‐deoxy‐d‐glucose positron emission tomography/computed tomography (FDG‐PET/CT) and bone marrow aspirate and trephine biopsies (BMAT) are used to identify disease involvement.
Imogen Andrews +3 more
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Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Jurnal Nasional Teknik Elektro, 2022 Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
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Control Flow Checking or Not? (for Soft Errors) [PDF]
ACM Transactions on Embedded Computing Systems, 2019 Huge leaps in performance and power improvements of computing systems are driven by rapid technology scaling, but technology scaling has also rendered computing systems susceptible to soft errors. Among the soft error protection techniques, Control Flow Checking (CFC) based techniques have gained a reputation of being lightweight yet effective.
Abhishek Rhisheekesan +2 more
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