Results 21 to 30 of about 1,200,056 (341)
Approximate MIMO Iterative Processing with Adjustable Complexity Requirements [PDF]
, 2011 Targeting always the best achievable bit error rate (BER) performance in iterative receivers operating over multiple-input multiple-output (MIMO) channels may result in significant waste of resources, especially when the achievable BER is orders of ...
Gerd Ascheid +2 more
core +1 more source
Impact of Microarchitectural Differences of RISC-V Processor Cores on Soft Error Effects
IEEE Access, 2018 In this paper, we compare how radiation-induced soft errors affect the execution results of user-level applications on different processor cores that implement the same instruction set architecture (ISA).
Hyungmin Cho
doaj +1 more source
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC [PDF]
, 2007 This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology.
Benso, Alfredo +6 more
core +3 more sources
IEEE Access, 2020 Deep Learning techniques have been successfully used to solve a wide range of computer vision problems. Due to their high computation complexity, specialized hardware accelerators are being proposed to achieve high performance and efficiency for deep ...
Muhammad Salman Ali +6 more
doaj +1 more source
Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery [PDF]
, 2014 The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge.
González Colás, Antonio María +2 more
core +1 more source
Error Correction For Soft Errors
Journal of Electrical & Electronic Systems, 2018 Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC,
Dhanushya T, Latha T
openaire +1 more source
A canonical ensemble approach to graded-response perceptrons [PDF]
, 1998 Perceptrons with graded input-output relations and a limited output precision are studied within the Gardner-Derrida canonical ensemble approach. Soft non- negative error measures are introduced allowing for extended retrieval properties.
A. Treves +26 more
core +2 more sources
EBSCN: An Error Backtracking Method for Soft Errors Based on Clustering and a Neural Network
IEEE Access, 2019 With the development of integrated circuit design technology, soft errors have become an important threat to system reliability, and software-based fault-tolerant techniques are gradually attracting people's attention.
Nan Zhang +3 more
doaj +1 more source
On boundary layer in the Mindlin plate model: Levy plates [PDF]
, 2008 This work is related to the bending problem of thick rectangular Levy plates. Series solution for the Mindlin (thick) plate model is obtained and represented as a sum of the Kirchhoff (thin) plate model solution, the ``shear terms'' and the ``boundary ...
Brank, Boštjan
core +1 more source
Identify Silent Data Corruption Vulnerable Instructions Using SVM
IEEE Access, 2019 Silent data corruption (SDC) is the most insidious and harmful result type of soft error. Identify program vulnerable instructions (PVIns) that are likely to cause SDCs is extremely significant on selective software-based protection techniques.
Na Yang, Yun Wang
doaj +1 more source