Results 31 to 40 of about 2,860,882 (305)
A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs
Advances in Electrical and Computer Engineering, 2013 The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level.
KIM, J. T., PARK, J. K.
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A Methodology to Assess Output Vulnerability Factors for Detecting Silent Data Corruption
IEEE Access, 2019 As process technology scales, electronic devices become more susceptible to soft error induced by radiation. Silent data corruption (SDC) is considered the most severe outcome incurred by soft error.
Junchi Ma, Zongtao Duan, Lei Tang
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Soft Error Characterization on Scientific Applications
2018 IEEE 16th Intl Conf on Dependable, Autonomic and Secure Computing, 16th Intl Conf on Pervasive Intelligence and Computing, 4th Intl Conf on Big Data Intelligence and Computing and Cyber Science and Technology Congress(DASC/PiCom/DataCom/CyberSciTech), 2018 Decreasing transistor sizes, aggressive power optimization techniques and higher operation frequencies lead to increase error rates. While researchers addressed reliable computing, there is still lack of study for providing the fundamental understanding of error propagation. In this work, we characterize error propagation at software level by utilizing
Zuhal Ozturk +3 more
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MicromachinesWith the rapid development of semiconductor technology, the reduction in device operating voltage and threshold voltage has made integrated circuits more susceptible to the effects of particle radiation. Moreover, as process sizes decrease, the impact of
Rui Dong +6 more
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Iterative Multiuser Minimum Symbol Error Rate Beamforming Aided QAM Receiver
, 2008 A novel iterative soft interference cancellation (SIC) aided beamforming receiver is developed for high-throughput quadrature amplitude modulation systems.
Tan, S., Chen, Sheng, Hanzo, L.
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IEEE Access, 2019 This paper presents two novel quadruple cross-coupled memory cell designs, namely QCCM10T and QCCM12T, with protection against single event upsets (SEUs) and double-node upsets (DNUs).
Aibin Yan +6 more
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FEBS Letters, EarlyView.We present robust protocols for the preparation of supported lipid bilayers (SLBs) incorporating either Salmonella smooth LPS or outer membrane vesicles (OMVs). We use a combination of quartz crystal microbalance with dissipation (QCM‐D) and fluorescence microscopy to both characterize the SLBs of various compositions and to probe their interactions ...
Hudson P. Pace +6 more
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Modeling Soft-Error Reliability Under Variability
, 2021 The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in deep submicron technologies are characterized as the major critical issues of high-performance integrated circuits.
Cardoso Medeiros, G. (author) +5 more
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Molecular Oncology, EarlyView.Circulating microRNAs as biomarkers of cachexia and sex‐specific cancer in senior dogs. In 25 client‐owned dogs, four circulating miRNAs (miR‐15a, miR‐15b, miR‐16, miR‐140) were downregulated in cachexia, with miR‐16 the strongest individual biomarker (AUC = 0.899).
Soon‐Seok Park +6 more
wiley +1 more source
CRC-Aided Fixed Complexity Error Pattern Estimation Technique
IEEE Access, 2022 Various techniques using cyclic redundancy check (CRC) codes for error correction have been proposed. In previous techniques, a small number of unreliable bits in a packet were toggled in order to change negative acknowledgement (NAK) into ...
Juhee Yun, Nulibyul Kim, Jaekwon Kim
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