Results 1 to 10 of about 133,634 (266)
Applied Sciences, 2022 Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang +5 more
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Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node
Applied Sciences, 2022 Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash +6 more
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SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview
Micromachines, 2022 Microprocessors use static random-access memory (SRAM) cells in the cache memory design. As a part of the central computing component, their performance is critical.
Waqas Gul +2 more
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SEDAR: Soft Error Detection and Automatic Recovery in High Performance Computing Systems
Journal of Computer Science and Technology, 2020 Reliability and fault tolerance have become aspects of growing relevance in the field of HPC, due to the increased probability that faults of different kinds will occur in these systems.
Diego Montezanti
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Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell
Sensors, 2021 Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems.
Bharathi Raj Muthu +6 more
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Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Jurnal Nasional Teknik Elektro, 2022 Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
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In-Pipeline Processor Protection against Soft Errors
Journal of Low Power Electronics and Applications, 2023 The shrinking of technology nodes allows higher performance, but susceptibility to soft errors increases. The protection has been implemented mainly by lockstep or hardened process techniques, which results in a lower frequency, a larger area, and higher
Ján Mach +2 more
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Approximate Triple Modular Redundancy: A Survey
IEEE Access, 2020 In recent years, approximate computing (AC) has attracted attention owing to its tradeoff between the exactness of computations and performance gains. AC has also been probed for the technique of Triple modular redundancy (TMR). TMR is a well-known fault
Tooba Arifeen +2 more
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Sensors, 2023 A soft sensor concept is typically developed and calibrated for individual bioprocesses in a time-consuming manual procedure. Following that, the prediction performance of these soft sensors degrades over time, due to changes in raw materials, biological
Manuel Siegl +6 more
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Modeling Application-Level Soft Error Effects for Single-Event Multi-Bit Upsets
IEEE Access, 2019 Transient errors induced by radiations cause bit-flips in flip-flops (flip-flop soft errors). Modeling the error resilience level of a target system for flip-flop soft errors is a crucial step to achieve a cost-effective error resilience solution.
Hyungmin Cho, Kon-Woo Kwon
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