Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning [PDF]
Jurnal Nasional Teknik Elektro, 2022 Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
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Applying Reinforcement Learning to Protect Deep Neural Networks from Soft Errors [PDF]
SensorsWith the advance of Artificial Intelligence, Deep Neural Networks are widely employed in various sensor-based systems to analyze operational conditions.
Peng Su +3 more
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State-of-the-art 3D analysis of soft tissue prediction for orthognathic correction of dentofacial deformities in the Egyptian population [PDF]
BMC Oral HealthObjectives To evaluate the accuracy of soft tissue simulation in bimaxillary osteotomy for orthognathic surgical correction of Class III dentofacial deformities using 3D conformation meshes and facial aesthetic units.
Nehal Ibrahim Shobair +6 more
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Deep learning-based prediction of PFAS toxicity in zebrafish [PDF]
Scientific ReportsOne such problem that is important in designing reliable circuits is soft due to high-energy particle strikes in combinational circuits. Soft errors affect the configuration bits that determine the circuit routing and logic and produce permanent errors ...
Kanagaraj Ramasamy +1 more
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Applied Sciences, 2022 Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang +5 more
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Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node
Applied Sciences, 2022 Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash +6 more
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SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview
Micromachines, 2022 Microprocessors use static random-access memory (SRAM) cells in the cache memory design. As a part of the central computing component, their performance is critical.
Waqas Gul +2 more
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SEDAR: Soft Error Detection and Automatic Recovery in High Performance Computing Systems
Journal of Computer Science and Technology, 2020 Reliability and fault tolerance have become aspects of growing relevance in the field of HPC, due to the increased probability that faults of different kinds will occur in these systems.
Diego Montezanti
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Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell
Sensors, 2021 Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems.
Bharathi Raj Muthu +6 more
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In-Pipeline Processor Protection against Soft Errors
Journal of Low Power Electronics and Applications, 2023 The shrinking of technology nodes allows higher performance, but susceptibility to soft errors increases. The protection has been implemented mainly by lockstep or hardened process techniques, which results in a lower frequency, a larger area, and higher
Ján Mach +2 more
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