Results 11 to 20 of about 133,634 (266)

Applying Reinforcement Learning to Protect Deep Neural Networks from Soft Errors [PDF]

open access: yesSensors
With the advance of Artificial Intelligence, Deep Neural Networks are widely employed in various sensor-based systems to analyze operational conditions.
Peng Su   +3 more
doaj   +2 more sources

Assessment of inhalation technique in patients with bronchial asthma and chronic obstructive pulmonary disease [PDF]

open access: yesТерапевтический архив, 2023
Aim. Investigate inhalation techniques using different inhalers types and their effect on the course of disease. Materials and methods. This cross-sectional study included 110 patients with asthma, chronic obstructive pulmonary disease using the ...
Natalia V. Trushenko   +6 more
doaj   +1 more source

Understanding soft errors in uncore components [PDF]

open access: yesProceedings of the 52nd Annual Design Automation Conference, 2015
The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors.
Hyungmin Cho   +3 more
openaire   +2 more sources

Formal Analysis of Soft Errors using Theorem Proving [PDF]

open access: yesElectronic Proceedings in Theoretical Computer Science, 2013
Modeling and analysis of soft errors in electronic circuits has traditionally been done using computer simulations. Computer simulations cannot guarantee correctness of analysis because they utilize approximate real number representations and pseudo ...
Sofiène Tahar   +2 more
doaj   +1 more source

Fast and Accurate Error Simulation for CNNs Against Soft Errors

open access: yesIEEE Transactions on Computers, 2023
The great quest for adopting AI-based computation for safety-/mission-critical applications motivates the interest towards methods for assessing the robustness of the application w.r.t. not only its training/tuning but also errors due to faults, in particular soft errors, affecting the underlying hardware. Two strategies exist: architecture-level fault
Bolchini C.   +3 more
openaire   +3 more sources

WCET-Aware Control Flow Checking With Super-Nodes for Resource-Constrained Embedded Systems

open access: yesIEEE Access, 2018
Safety-critical embedded systems in application domains, such as aerospace, automotive, and industrial automation, must satisfy dual requirements of fault-tolerance and real-time predictability.
Ming Zhang   +3 more
doaj   +1 more source

A Novel Low Power Bitcell Design Featuring Inherent SEU Prevention and Self Correction Capabilities

open access: yesJournal of Low Power Electronics and Applications, 2015
The pursuit of continuous scaling of electronic devices in the semiconductor industry has led to two unintended but significant outcomes: a rapid increase in susceptibility to radiation induced errors, and an overall rise in power consumption.
Oron Chertkow   +3 more
doaj   +1 more source

Application Specified Soft-Error Failure Rate Analysis Using Sequential Equivalence Checking Techniques

open access: yesTsinghua Science and Technology, 2020
Soft errors have become a critical challenge as a result of technology scaling. Existing circuit-hardening techniques are commonly associated with prohibitive overhead of performance, area, and power.
Tun Li, Qinhan Yu, Hai Wan, Sikun Li
doaj   +1 more source

Error Correction For Soft Errors

open access: yesJournal of Electrical & Electronic Systems, 2018
Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC,
Dhanushya T, Latha T
openaire   +1 more source

Custom Scrubbing for Robust Configuration Hardening in Xilinx FPGAs

open access: yesInstruments, 2019
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly limited by the sensitivity of these devices to radiation-induced upsets in their configuration.
Raffaele Giordano   +3 more
doaj   +1 more source

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