Results 11 to 20 of about 1,809,083 (306)

SETTOFF : a fault tolerant flip-flop for building cost-efficient reliable systems [PDF]

open access: yes, 2012
Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs
Zwolinski, Mark   +3 more
core   +2 more sources

Approximate Triple Modular Redundancy: A Survey

open access: yesIEEE Access, 2020
In recent years, approximate computing (AC) has attracted attention owing to its tradeoff between the exactness of computations and performance gains. AC has also been probed for the technique of Triple modular redundancy (TMR). TMR is a well-known fault
Tooba Arifeen   +2 more
doaj   +1 more source

Modeling Application-Level Soft Error Effects for Single-Event Multi-Bit Upsets

open access: yesIEEE Access, 2019
Transient errors induced by radiations cause bit-flips in flip-flops (flip-flop soft errors). Modeling the error resilience level of a target system for flip-flop soft errors is a crucial step to achieve a cost-effective error resilience solution.
Hyungmin Cho, Kon-Woo Kwon
doaj   +1 more source

Generalizability of Soft Sensors for Bioprocesses through Similarity Analysis and Phase-Dependent Recalibration

open access: yesSensors, 2023
A soft sensor concept is typically developed and calibrated for individual bioprocesses in a time-consuming manual procedure. Following that, the prediction performance of these soft sensors degrades over time, due to changes in raw materials, biological
Manuel Siegl   +6 more
doaj   +1 more source

Understanding soft errors in uncore components [PDF]

open access: yesProceedings of the 52nd Annual Design Automation Conference, 2015
The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors.
Hyungmin Cho   +3 more
openaire   +4 more sources

Assessment of inhalation technique in patients with bronchial asthma and chronic obstructive pulmonary disease [PDF]

open access: yesТерапевтический архив, 2023
Aim. Investigate inhalation techniques using different inhalers types and their effect on the course of disease. Materials and methods. This cross-sectional study included 110 patients with asthma, chronic obstructive pulmonary disease using the ...
Natalia V. Trushenko   +6 more
doaj   +1 more source

Formal Analysis of Soft Errors using Theorem Proving [PDF]

open access: yesElectronic Proceedings in Theoretical Computer Science, 2013
Modeling and analysis of soft errors in electronic circuits has traditionally been done using computer simulations. Computer simulations cannot guarantee correctness of analysis because they utilize approximate real number representations and pseudo ...
Sofiène Tahar   +2 more
doaj   +1 more source

Fast and Accurate Error Simulation for CNNs Against Soft Errors

open access: yesIEEE Transactions on Computers, 2023
The great quest for adopting AI-based computation for safety-/mission-critical applications motivates the interest towards methods for assessing the robustness of the application w.r.t. not only its training/tuning but also errors due to faults, in particular soft errors, affecting the underlying hardware. Two strategies exist: architecture-level fault
Bolchini C.   +3 more
openaire   +5 more sources

WCET-Aware Control Flow Checking With Super-Nodes for Resource-Constrained Embedded Systems

open access: yesIEEE Access, 2018
Safety-critical embedded systems in application domains, such as aerospace, automotive, and industrial automation, must satisfy dual requirements of fault-tolerance and real-time predictability.
Ming Zhang   +3 more
doaj   +1 more source

A Novel Low Power Bitcell Design Featuring Inherent SEU Prevention and Self Correction Capabilities

open access: yesJournal of Low Power Electronics and Applications, 2015
The pursuit of continuous scaling of electronic devices in the semiconductor industry has led to two unintended but significant outcomes: a rapid increase in susceptibility to radiation induced errors, and an overall rise in power consumption.
Oron Chertkow   +3 more
doaj   +1 more source

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