Results 21 to 30 of about 139,876 (307)
Modeling Application-Level Soft Error Effects for Single-Event Multi-Bit Upsets
IEEE Access, 2019 Transient errors induced by radiations cause bit-flips in flip-flops (flip-flop soft errors). Modeling the error resilience level of a target system for flip-flop soft errors is a crucial step to achieve a cost-effective error resilience solution.
Hyungmin Cho, Kon-Woo Kwon
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Modelling and mitigation of soft-errors in CMOS processors [PDF]
, 2014 The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors have been addressed here, including an accurate simulation model to emulate soft-errors in a gate-level net list, a simulation framework to study the ...
Rohani, A.
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Fully Adaptive Stochastic Handling of Soft-Errors in Real-Time Systems
IEEE Access, 2021 In the design of real-time systems, it is becoming increasingly important to take soft-error tolerance into account. While hardening techniques such as error detection and error correction enable us to build systems that can better tolerate soft-errors ...
Hyung-Chan An, Hoeseok Yang
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Statistical Reliability Estimation of Microprocessor-Based Systems [PDF]
, 2012 What is the probability that the execution state of a given microprocessor running a given application is correct, in a certain working environment with a given soft-error rate?
A. Benso +16 more
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Fault Detection for ASIC Design Reliability on Resistive Delay Faults and Strength-Based Soft-Errors
, 2010 Soft-errors (SEs) and delay faults (DFs) frequently occur in modern high-density, high-speed, low-power VLSI circuits. Therefore, SE hardened design and DF testing are essential. This thesis introduces two novel methods for soft-error detection and delay
Mohammad R.S. Javaheri (10863036)
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Single-Event Upset Analysis and Protection in High Speed Circuits [PDF]
, 2006 The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at
Lofti-Kamran, P. +7 more
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Characterizing System-Level Masking Effects against Soft Errors
, 2021 From early design phases to final release, the reliability of modern embedded systems against soft errors should be carefully considered. Several schemes have been proposed to protect embedded systems against soft errors, but they are neither always ...
Yohan Ko
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Soft Error Characterization on Scientific Applications
2018 IEEE 16th Intl Conf on Dependable, Autonomic and Secure Computing, 16th Intl Conf on Pervasive Intelligence and Computing, 4th Intl Conf on Big Data Intelligence and Computing and Cyber Science and Technology Congress(DASC/PiCom/DataCom/CyberSciTech), 2018 Decreasing transistor sizes, aggressive power optimization techniques and higher operation frequencies lead to increase error rates. While researchers addressed reliable computing, there is still lack of study for providing the fundamental understanding of error propagation. In this work, we characterize error propagation at software level by utilizing
Zuhal Ozturk +3 more
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Collective Pointing: Protecting Pointer ValuesAgainst Soft Errors [PDF]
, 2015 Soft errors are becoming a significant design concern for microprocessor designers to make reliable systems with today’s manufacturing technology. Its occurrence rate (Soft Error Rate – SER) increases with lower supply voltage, higher frequency and ...
Ergin, Oguz +2 more
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An Investigation into Soft Error Detection Efficiency at Operating System Level
The Scientific World Journal, 2014 Electronic equipment operating in harsh environments such as space is subjected to a range of threats. The most important of these is radiation that gives rise to permanent and transient errors on microelectronic components.
Seyyed Amir Asghari +2 more
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