Exploiting Data Representation for Fault Tolerance [PDF]
, 2013 We explore the link between data representation and soft errors in dot products. We present an analytic model for the absolute error introduced should a soft error corrupt a bit in an IEEE-754 floating-point number.
Elliott, James +2 more
core +2 more sources
WCET-Aware Control Flow Checking With Super-Nodes for Resource-Constrained Embedded Systems
IEEE Access, 2018 Safety-critical embedded systems in application domains, such as aerospace, automotive, and industrial automation, must satisfy dual requirements of fault-tolerance and real-time predictability.
Ming Zhang +3 more
doaj +1 more source
Distributed probabilistic-data-association-based soft reception employing base station cooperation in MIMO-aided multiuser multicell systems [PDF]
, 2011 Intercell cochannel interference (CCI) mitigation is investigated in the context of cellular systems relying on dense frequency reuse (FR). A distributed base-station (BS)-cooperation-aided soft reception scheme using the probabilistic data association ...
Hanzo, Lajos +3 more
core +1 more source
A Novel Low Power Bitcell Design Featuring Inherent SEU Prevention and Self Correction Capabilities
Journal of Low Power Electronics and Applications, 2015 The pursuit of continuous scaling of electronic devices in the semiconductor industry has led to two unintended but significant outcomes: a rapid increase in susceptibility to radiation induced errors, and an overall rise in power consumption.
Oron Chertkow +3 more
doaj +1 more source
Quasi-infra-red fixed points and renormalisation group invariant trajectories for non-holomorphic soft supersymmetry breaking [PDF]
, 1999 In the MSSM the quasi-infra-red fixed point for the top-quark Yukawa coupling gives rise to specific predictions for the soft-breaking parameters. We discuss the extent to which these predictions are modified by the introduction of additional ``non ...
Jack, I., Jones, D. R. T.
core +2 more sources
Error Correction For Soft Errors
Journal of Electrical & Electronic Systems, 2018 Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC,
Dhanushya T, Latha T
openaire +1 more source
Soft lithography replication of polymeric microring optical resonators [PDF]
, 2003 We have developed a soft lithography method to replicate polymeric integrated optical devices. In this method, the master device and the molded replica are made of the same materials, allowing direct comparison. To evaluate the quality of the replication,
Huang, Yanyi +3 more
core +1 more source
Custom Scrubbing for Robust Configuration Hardening in Xilinx FPGAs
Instruments, 2019 The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly limited by the sensitivity of these devices to radiation-induced upsets in their configuration.
Raffaele Giordano +3 more
doaj +1 more source
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC [PDF]
, 2007 This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology.
Benso, Alfredo +6 more
core +3 more sources
IEEE Access, 2019 A fault-tolerant hardening-by-design frequency divider has been proposed for clock and data recovery in a 28-nm CMOS process. By means of the mandatory updating mechanism, the proposed divider can update the state of the D flip-flops from an error state ...
Hengzhou Yuan +5 more
doaj +1 more source