Results 41 to 50 of about 139,876 (307)

A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays

open access: yesIEEE Access
MBU is an increasing challenge in SRAM memory, due to the chip’s large area of SRAM, and supply power scaling applied to reduce static consumption.
Daniel Gil-Tomas   +4 more
doaj   +1 more source

A Numerical–Experimental Approach for Multi‐Matrix Fiber‐Reinforced Plastics Characterization Using Finite Element Model Updating

open access: yesAdvanced Engineering Materials, EarlyView.
A numerical–experimental framework is developed for characterizing multi‐matrix fiber‐reinforced polymers (MM‐FRPs) combining epoxy and polyurethane matrices. Harmonic bending tests are integrated with finite element model updating (FEMU) to simultaneously identify elastic and viscoelastic material parameters.
Rodrigo M. Dartora   +4 more
wiley   +1 more source

Additive Gaussian Process Regression for Predictive Design of High‐Performance, Printable Silicones

open access: yesAdvanced Engineering Materials, EarlyView.
A chemistry‐aware design framework for tuning printable polydimethylsiloxane (PDMS) for vat photopolymerization (VPP) is developed using additive Gaussian process (GP) modeling. Polymer network mechanics informs variable groupings, feasible formulation constraints, and interaction variables.
Roxana Carbonell   +3 more
wiley   +1 more source

Correcting Soft Errors Online in Fast Fourier Transform

open access: yes, 2017
While many algorithm-based fault tolerance (ABFT) schemes have been proposed to detect soft errors offline in the fast Fourier transform (FFT) after computation finishes, none of the existing ABFT schemes detect soft errors online before the computation ...
Liang, Xin   +6 more
core   +2 more sources

Programming Limitations and Challenges on Consumer Hardware GPU

open access: yesInternational Journal of Emerging Engineering and Technology
Traditionally, high-performance computing was dominated by processors specifically designed to execute highly efficient mathematical calculations. But there are major architectural, thermal and software challenges involved in using consumer-grade and ...
Muhammad Ahmad, Nabeel Akram, Hira Arif
doaj   +1 more source

Performance of Soft Viterbi Decoder enhanced with Non-Transmittable Codewords for storage media

open access: yesCogent Engineering, 2018
The introduction of Non-Transmittable Codewords (NTCs) into Viterbi Algorithm Decoder has emerged as one of the best ways of improving performance of the Viterbi Algorithm Decoder.
Kilavo Hassan   +2 more
doaj   +1 more source

Creating Ti–Fe α/β Alloys by Diffusion‐Driven Solid‐State Processing

open access: yesAdvanced Engineering Materials, EarlyView.
This study proposes making alloys containing fast diffusing elements that are difficult to produce by ingot metallurgy, by diffusion‐driven solid‐state HIP processing of elemental powders and low‐temperature homogenisation. Here, novel Fe‐Ti α–β alloys are formed having fine α–β lamellae, a small β prior grain size without significant intermetallics ...
Jiaqi Xu   +10 more
wiley   +1 more source

Incorporation of Selenium into Sol–Gel‐Derived Bioactive Glass: Influence on Glass Structure, Bioactivity, and its Selective Cytotoxicity

open access: yesAdvanced Engineering Materials, EarlyView.
Selenium was incorporated into a sol–gel‐derived bioactive glass to enable sustained therapeutic ion release. The selenium‐containing glass preserved bioactivity while selectively inducing cytotoxicity in osteosarcoma cells and maintaining osteoblastic viability.
Breno Rocha Barrioni   +7 more
wiley   +1 more source

An efficient technique to protect serial shift registers against soft errors

open access: yes, 2013
This brief presents a technique to efficiently correct single soft errors in serial shift registers. The proposed scheme uses two copies of the shift register.
Pontarelli, Salvatore   +4 more
core   +1 more source

Electron inducing soft errors in 28 nm system-on-Chip

open access: yes, 2020
The 28 nm system-on-chip (SoC) was irradiated by 12 MeV electron at the China Institute of Atomic Energy (CIAE) for the first time. Soft errors in the on-chip memory (OCM), D-Cache, Register and BRAM blocks were investigated.
Li Y.   +10 more
core   +1 more source

Home - About - Disclaimer - Privacy