Results 41 to 50 of about 240,975 (314)
Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Jurnal Nasional Teknik Elektro, 2022 Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
doaj +1 more source
FEBS Open Bio, EarlyView.Bioscience students were asked for their opinions on the value and teaching of skills. 204 responded that teamwork, time management and study skills are necessary to reach University, that scientific writing, research, laboratory and presentation skills are taught effectively during their studies, while other skills are gained inherently through study ...
Janella Borrell, Susan Crennell
wiley +1 more source
Iterative Soft Interference Cancellation Aided Minimum Bit Error Rate Uplink Receiver Beamforming [PDF]
, 2006 Iterative multiuser receivers constitute an effective solution for transmission over Multiple Access Interference (MAI) infested channels, when invoking a combined multiuser detector and channel decoder.
Tan, S., Xu, L., Hanzo, L., Chen, S.
core
What Do Large Language Models Know About Materials?
Advanced Engineering Materials, EarlyView.If large language models (LLMs) are to be used inside the material discovery and engineering process, they must be benchmarked for the accurateness of intrinsic material knowledge. The current work introduces 1) a reasoning process through the processing–structure–property–performance chain and 2) a tool for benchmarking knowledge of LLMs concerning ...
Adrian Ehrenhofer +2 more
wiley +1 more source
Advanced Engineering Materials, EarlyView.A numerical–experimental framework is developed for characterizing multi‐matrix fiber‐reinforced polymers (MM‐FRPs) combining epoxy and polyurethane matrices. Harmonic bending tests are integrated with finite element model updating (FEMU) to simultaneously identify elastic and viscoelastic material parameters.
Rodrigo M. Dartora +4 more
wiley +1 more source
False Error Study of On-line Soft Error Detection Mechanisms [PDF]
, 2008 With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We
Parekhji, Rubin A +2 more
core
A Fast Soft Bit Error Rate Estimation Method
EURASIP Journal on Wireless Communications and Networking, 2010 We have suggested in a previous publication a method to estimate the Bit Error Rate (BER) of a digital communications system instead of using the famous Monte Carlo (MC) simulation.
Samir Saoudi +3 more
doaj +2 more sources
Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature
IEEE AccessThis study examines the impact of soft error by heavy ions on saddle fin-based dynamic random access memory (DRAM). The investigation is conducted using technology computer-aided design (TCAD) simulation at different temperatures ranging from 77 to 300 K.
Minsang Ryu +8 more
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Optical Multi-Context Blind Scrubbing for Field Programmable Gate Arrays
IEEE Photonics Journal, 2020 This paper presents aproposal of a new optical multi-context blind scrubbing that can not only increase the soft-error tolerance of the configuration memory of field programmable gate arrays (FPGAs) but also support high-speed dynamic reconfiguration ...
Yusuke Takaki, Minoru Watanabe
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Creating Ti–Fe α/β Alloys by Diffusion‐Driven Solid‐State Processing
Advanced Engineering Materials, EarlyView.This study proposes making alloys containing fast diffusing elements that are difficult to produce by ingot metallurgy, by diffusion‐driven solid‐state HIP processing of elemental powders and low‐temperature homogenisation. Here, novel Fe‐Ti α–β alloys are formed having fine α–β lamellae, a small β prior grain size without significant intermetallics ...
Jiaqi Xu +10 more
wiley +1 more source