Results 61 to 70 of about 2,860,882 (305)
Entropy‐Driven Design of Low‐Melting‐Point Alloys via Compositionally Complex Strategy
Advanced Engineering Materials, EarlyView.Conventional low‐melting‐point alloys (LMPAs) are limited by a narrow compositional space and inherent property trade‐offs. This review presents an entropy‐driven design strategy that overcomes these limitations, ushering in a new class of low‐melting‐point compositionally complex alloys (LMCCAs).
Yinghui Shang +6 more
wiley +1 more source
Soft error in FPGA-implemented asynchronous circuits [PDF]
, 2011 In this paper, we investigate the mechanism of soft error generation and propagation in asynchronous circuits which are implemented on FPGAs. The effects of the soft errors on Quasi-delay-insensitive (QDI) asynchronous circuits are analyzed.
Weidong Kuang +3 more
core +1 more source
Advanced Engineering Materials, EarlyView.HEA interlayers offer a versatile route for joining high‐performance structural materials. Their compositional and structural design regulates interfacial reactions, suppresses brittle IMCs, and improves metallurgical bonding. Sandwich interlayers further integrate defect healing with precipitation strengthening, enabling improved strength–ductility ...
Lin Yuan +4 more
wiley +1 more source
A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications
Applied SciencesWith continued scaling of CMOS technology, the critical charge required for state retention in SRAM cells has decreased, leading to increased vulnerability to radiation-induced soft errors such as single-event upsets (SEUs) and single-event multi-node ...
Sang-Jin Kim, Sung-Hun Jo
doaj +1 more source
The Analysis of Soft Error in C-Elements [PDF]
Indonesian Journal of Electrical Engineering and Computer Science, 2018 Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the circuit. C-element is one of the state holders that is used widely in the asynchronous circuit. In this paper, the investigation will focus on the vulnerability of two types of C-element towards soft errors.
Norhuzaimin Julai +2 more
openaire +1 more source
Elastic–Plastic Modeling and Experimental Characterization of Granular Jamming Actuators
Advanced Engineering Materials, EarlyView.Granular jamming enables rapid switching between soft and rigid mechanical states. Here, a reduced‐order elastic‐perfectly‐plastic beam framework captures pressure‐dependent loading, unloading, residual deformation, and hysteresis in jammed beams, while matching three‐point bending experiments across materials and geometries. The framework links design
Saheli Patel +2 more
wiley +1 more source
A Low-Power Read-Decoupled Radiation-Hardened 16T SRAM for Space Applications
Applied SciencesAdvancements in CMOS technology have significantly reduced both transistor dimensions and inter-device spacing, leading to a lower critical charge at sensitive nodes.
Sung-Jun Lim, Sung-Hun Jo
doaj +1 more source
Iterative channel equalization, channel decoding and source decoding
, 2005 The performance of soft source decoding is evaluated over dispersive AWGN channels. By employing source codes having error-correcting capabilities, such as Reversible Variable-Length Codes (RVLCs) and Variable-Length Error-Correcting (VLEC) codes, the ...
Wang, J. +5 more
core +1 more source
SOFT ERROR DETECTION IN ADDER SYSTEM [PDF]
, 2022 Soft error can be simplified as a disruption that occurred in the circuit. Soft error can cause a malfunction in the whole digital system. The common source of soft error is caused by radiation and due to a charged particle strike at a sensitive node.
NUR AISYA JASMIN BINTI MAZLAN, -
core
Rotary 3D Printing With Integrated Electroplating
Advanced Engineering Materials, EarlyView.A rotary material extrusion platform integrates localized copper electroplating with printing and encapsulation to fabricate cylindrical polymer–metal structures containing fully embedded, low‐resistance conductive pathways that enable internal Joule heating and thermally activated shape‐memory responses.
Antonio Zagaria +5 more
wiley +1 more source