Results 61 to 70 of about 240,975 (314)

Survey of Soft Error Mitigation Techniques Applied to LEON3 Soft Processors on SRAM-Based FPGAs

open access: yesIEEE Access, 2020
Soft-core processors implemented in SRAM-based FPGAs are an attractive option for applications to be employed in radiation environments due to their flexibility, relatively-low application development costs, and reconfigurability features enabling them ...
Server Kasap   +4 more
doaj   +1 more source

An Experimental High‐Throughput Approach for the Screening of Hard Magnet Materials

open access: yesAdvanced Engineering Materials, EarlyView.
An entire workflow for the high‐throughput characterization and analysis of compositionally graded magnetic films is presented. Characterization protocols, data management tools and data analysis approaches are illustrated with test case Sm(Fe, V)12 based films.
William Rigaut   +16 more
wiley   +1 more source

Acquisition of m-Sequences using Soft Sequential Estimation [PDF]

open access: yes, 2004
—A novel sequential estimation method is proposed for the initial synchronization of pseudonoise (PN) signals derived from -sequences. This sequential estimation method is designed based on the principle of recursive soft-in/soft-out (SISO) decoding, and
Yang, L-L., Hanzo, L.
core  

Network planning aspects of DS-CDMA with particular emphasis on soft handoff [PDF]

open access: yes, 1993
A study into the application of soft handoff in wideband direct sequence code division multiple access (DS-CDMA) communications systems is described.
Simmonds, CM, Beach, MA
core   +1 more source

The Impact of Positional Errors on Soft Classification Accuracy Assessment: A Simulation Analysis

open access: yesRemote Sensing, 2015
Validating or accessing the accuracy of soft classification maps has rapidly developed over the past few years. This assessment employs a soft error matrix as generalized from the traditional, hard classification error matrix.
Jianyu Gu   +2 more
doaj   +1 more source

Microstructure Reconstruction in Battery Electrodes Using Machine Learning Based on Low‐Voltage Focused Ion Beam–Scanning Electron Microscopy Tomography Images

open access: yesAdvanced Engineering Materials, EarlyView.
Low‐voltage FIB‐SEM tomography combined with a image preprocessing pipeline improves phase contrast and enables reliable machine‐learning segmentation of conductive networks in lithium‐ion battery electrodes. Structural descriptors are extracted from segmented images, done semimanually and automated, and compared.
Lisa Beran   +6 more
wiley   +1 more source

Soft error mechanisms, modeling and mitigation [PDF]

open access: yes, 2016
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects.
Sayil, Selahattin
core   +1 more source

Exploration of Pseudobinary Alloys (Al–Mn)‐(Co–Fe–Ni) to Design High‐Entropy and Compositionally Complex Alloys to Stabilize the τ Phase in Al–Mn‐Based Ferromagnetic Alloys

open access: yesAdvanced Engineering Materials, EarlyView.
This experimental study investigates the thermodynamic limits of the Al–Mn τ ferromagnetic phase within complex‐composition alloys (CCAs). Using nine rare‐earth‐free compositions, it explores a broad region of the pseudobinary AlMnCoFeNi system. The results reveal intricate links between composition, phase stability, and magnetic behavior, highlighting
Sacha Plagnol‐Chauzu   +4 more
wiley   +1 more source

Influence of Geometric Design on Mechanical Performance of Auxetic Metastructure

open access: yesAdvanced Engineering Materials, EarlyView.
Strategic geometric reinforcement transforms auxetic performance. This study evaluates 3D‐printed arrowhead metastructures, revealing that a modified design with local ring reinforcement suppresses premature failure to achieve superior energy absorption and structural efficiency.
Muhammad Gulzari   +3 more
wiley   +1 more source

A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications

open access: yesApplied Sciences
With continued scaling of CMOS technology, the critical charge required for state retention in SRAM cells has decreased, leading to increased vulnerability to radiation-induced soft errors such as single-event upsets (SEUs) and single-event multi-node ...
Sang-Jin Kim, Sung-Hun Jo
doaj   +1 more source

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