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Soft error assessments for servers
2010 IEEE International Reliability Physics Symposium, 2010In order to assess the soft error rate (SER) of a server, it is important to not only quantify the soft error contribution of the individual semiconductor components, but also to account for derating and for SER mitigation like hardening and shielding. Derating describes the fact that not every soft error has an impact.
K Paul Muller, Pia N. Sanda
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Single Event Soft Error Mechanisms
2016Researchers mostly considered Single Event Transients (SET) as the main cause of radiation induced transient failure of combinatorial circuits. However, recent research has reported new mechanisms for such transient failures such as radiation induced soft delays, clock jitter and race, single event crosstalk noise, delay and speed up effects.
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Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements
2023 International Conference on IC Design and Technology (ICICDT), 2023Haruto Sugisaki +4 more
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European Journal of Science, Innovation and Technology, 2022
A soft error was not recognized as a major problem until the 1970s. Now it is confirmed that a soft error is caused by alpha rays radiating. The small cosmic ray-induced neutrons can cause a soft error served as the electric charge contained in memory chip. A memory chip is a type of integrated circuit.
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A soft error was not recognized as a major problem until the 1970s. Now it is confirmed that a soft error is caused by alpha rays radiating. The small cosmic ray-induced neutrons can cause a soft error served as the electric charge contained in memory chip. A memory chip is a type of integrated circuit.
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Soft Errors on Digital Components
2005Data from many application fields confirm that digital components implemented in modern Very Deep Sub Micron technologies are more and more susceptible to Soft Errors, i.e. bit-flip in memories or in sequential elements. It is an emerging reliability problem that cannot be furthermore ignored and requires actions to be carried out at the various steps ...
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Circuit-Level Soft-Error Mitigation
2010In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft errors, a concern in the past for space applications, became a reliability issue at ground level. Alpha particles and atmospheric neutrons induce single-event upsets (SEUs) affecting memory cells, latches, and flip-flops, and single-event transients (
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