Results 281 to 290 of about 800,215 (343)

Soft error protection via fault-resilient data representations

open access: green, 2007
Muhammad M. M. Abdel Latif   +2 more
openalex   +1 more source

An Experimental Study of Soft Errors in Microprocessors

IEEE Micro, 2005
The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor.
R K Iyer
exaly   +2 more sources

Soft errors

Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, 2012
A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee   +2 more
openaire   +1 more source

Managing soft errors in ASICs

Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285), 2003
Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Larry Wissel   +4 more
openaire   +1 more source

Soft Error Mitigation

2021
Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck   +3 more
openaire   +1 more source

Soft errors: is the concern for soft-errors overblown?

IEEE International Conference on Test, 2005., 2006
Cosmic ray particles have the ability to either toggle the state of memory elements or create unwanted glitches in combinational logic that may be latched by memory elements. As supply voltages reduce and feature sizes become smaller in future technologies, soft error tolerance is considered a significant challenge for designing future electronic ...
openaire   +1 more source

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