Results 241 to 250 of about 5,011,192 (299)

Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

open access: yesAdvanced Engineering Materials, EarlyView.
Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer   +3 more
wiley   +1 more source

Benchmarking spike source localization algorithms in high density probes. [PDF]

open access: yesPLoS Comput Biol
Zhao H   +4 more
europepmc   +1 more source

Characterization of Defect Distribution in an Additively Manufactured AlSi10Mg as a Function of Processing Parameters and Correlations with Extreme Value Statistics

open access: yesAdvanced Engineering Materials, EarlyView.
Predicting extreme defects in additive manufacturing remains a key challenge limiting its structural reliability. This study proposes a statistical framework that integrates Extreme Value Theory with advanced process indicators to explore defect–process relationships and improve the estimation of critical defect sizes. The approach provides a basis for
Muhammad Muteeb Butt   +8 more
wiley   +1 more source

Evaluation of High Dynamic Range Imaging Methods for Luminance Measurements. [PDF]

open access: yesJ Imaging
Gevaux L   +5 more
europepmc   +1 more source

In Vivo Imaging With a Low-Cost MRI Scanner and Cloud Data Processing in Low-Resource Settings. [PDF]

open access: yesNMR Biomed
Guallart-Naval T   +18 more
europepmc   +1 more source

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