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Analysis of SRAM PUF Integrity Under Ionizing Radiation: Effects of Stored Data and Technology Node
IEEE Transactions on Nuclear ScienceUmeshwarnath Surendranathan +2 more
exaly
A Comparative Analysis of 65nm CMOS SRAM and Commercial SRAMs in Security Vulnerability Evaluation
2018Weng-Geng Ho +2 more
exaly
Ionizing Radiation-Induced Data Imprinting Effects in SRAM Arrays
IEEE Transactions on Nuclear ScienceUmeshwarnath Surendranathan +2 more
exaly
SSC: An SRAM-Based Silence Computing Design for On-chip Memory
Ziming Chen +5 moreopenaire +1 more source