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Endurance Paradox in Hafnium-Oxide-Based Silicon-Channel Ferroelectric Transistors. [PDF]

open access: yesACS Appl Mater Interfaces
Das A   +14 more
europepmc   +1 more source

Multipass Welding Stresses in Very Thick Plates and Their Reduction from Stress Relief Annealing

open access: yesMultipass Welding Stresses in Very Thick Plates and Their Reduction from Stress Relief Annealing
openaire  

Defect phases beyond grain boundaries. [PDF]

open access: yesMRS Bull
Korte-Kerzel S   +4 more
europepmc   +1 more source

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