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Comparison of the Reliability and Gap Differences Between Using the Varus-Valgus Stress Technique and Paddles Technique in Pre-Resection Balancing Phase of Robotic-Assisted Total Knee Arthroplasty. [PDF]

Arthroplast Today
Narkbunnam R, Kittipibul K, Chareancholvanich K, Achawakulthep C, Awirotananon K, Pornrattanamaneewong C.   +5 more
europepmc   +1 more source

The time-dependent reliability of CRTS III slab ballastless track structures based on direct probability integral method. [PDF]

Sci Rep
Wenchang Z, Xiao L, Junyan D, Huaxia Z, Qiufen T.   +4 more
europepmc   +1 more source

Towards Scalable System-Level Reliability Analysis

, 2009
openaire   +1 more source

Need Assessment for Specialised Hospitals at the Regional Level: A Potential Way Out of Medical Tourism. [PDF]

Cureus
Ahmed MF, Bhowmik P, Khan MA.
europepmc   +1 more source

The development of a performance evaluation index system for internet hospitals in Qingdao, China: A Delphi consensus study. [PDF]

SAGE Open Med
Cui N, Sun J, Sui X, Ma P, Sun J, Baloch Z, Cui J.   +6 more
europepmc   +1 more source

Facial Expression-Based Evaluation of the Emotion Estimation Software Kokoro Sensor in Healthy Individuals: Validation and Reliability Pilot Study. [PDF]

JMIR AI
Yoshihara S, Amano S, Takahashi K.
europepmc   +1 more source

Lifetime Reliability Optimization for Embedded Systems: A System-Level Approach [PDF]

, 2009
openaire  

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System Level Reliability Testing for High Reliability Devices

2007 9th Electronics Packaging Technology Conference, 2007
Purpose of this study was to investigate system level reliability for electronic devices intended to be used in industrial use conditions. The reliability of such devices should be extremely high, the intended useful lifetime being in the range of 10 to 30 years.
Sampsa Kuusiluoma, Janne Kiilunen, Johanna Virkki   +2 more
openaire   +1 more source

System-level reliability modeling for MPSoCs

Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, 2010
The reliability of multi-processor systems-on-chip (MPSoCs) is affected by several inter-dependent system-level and physical effects. Accurate and fast reliability modeling is a primary challenge in the design and optimization of reliable MPSoCs. This paper presents a reliability modeling framework that integrates device-, component-, and system-level ...
Yun Xiang, Thidapat Chantem, Robert P. Dick, X. Sharon Hu, Li Shang   +4 more
openaire   +1 more source