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A system-level reliability-growth model

1988. Proceedings., Annual Reliability and Maintainability Symposium,, 2003
Using a subsystem growth model developed by the authors together with the concepts associated with the composition of moments, the problem of system-level growth analysis is considered. It is shown, using the moments of the subsystem failure rate distributions as they change during test, how the moments of the distribution of the system level failure ...
D. Robinson, D. Dietrich
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System Level Reliability

2011
System reliability is discussed in this chapter. In order to understand how the whole product or an entire system operates, it is necessary to combine the effects of individual components. One of the most commonly used approaches is the Reliability Block Diagram (RBD) methodology, where each component/element is represented by a block.
Johan Liu   +5 more
openaire   +1 more source

ARET for system-level IC reliability simulation

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual., 2003
The simulator ARET (ASIC Reliability Evaluation Tool) is being developed at Georgia Institute of Technology. ARET focuses on system-level reliability with several efficient built-in system-level simulation models. By developing ARET, we are trying to focus on "real world" ICs - ICs with fabrication defects in devices and interconnect - and simulate IC ...
null Xiangdong Xuan   +2 more
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System-Level Reliability Exploration

2017
System-level reliability focuses on the problem of executing specific applications correctly on multi/many core systems. The literature on such issues can be classified in two directions: reliable task mapping and reliable network design. In this chapter two techniques to enhance reliability in system-level design are proposed.
Zheng Wang, Anupam Chattopadhyay
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Bottom-up digital system-level reliability modeling

2011 IEEE Custom Integrated Circuits Conference (CICC), 2011
We demonstrate here for the first time that it is possible by a bottom-up approach to build transistor- and gate-level models with enough accuracy to allow direct comparison with experimental degradations at system-level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy.
N. Ruiz Amador   +8 more
openaire   +1 more source

Design Optimization With System-Level Reliability Constraints

Journal of Mechanical Design, 2008
Reliability-based design optimization (RBDO) of mechanical systems is computationally intensive due to the presence of two types of iterative procedures—design optimization and reliability estimation. Single-loop RBDO algorithms offer tremendous savings in computational effort, but they have so far only been able to consider individual component ...
M. McDonald, S. Mahadevan
openaire   +1 more source

Reliability properties assessment at system level: a co-design framework

Proceedings Seventh International On-Line Testing Workshop, 2002
The reliability co-design project aims at integrating in a standard hw/sw co-design flow the elements for achieving a final system able to detect the occurrence of a fault during its operational life. The paper presents the focus of the project, the definition and identification of design methodologies for implementing the nominal, checking and checker
BOLCHINI, CRISTIANA   +3 more
openaire   +3 more sources

Reliability-Driven System-Level Synthesis for Mixed-Critical Embedded Systems

IEEE Transactions on Computers, 2013
This paper proposes a design methodology that enhances the classical system-level design flow for embedded systems to introduce reliability-awareness. The mapping and scheduling step is extended to support the application of hardening techniques to fulfill the required fault management properties that the final system must exhibit; moreover, the ...
BOLCHINI, CRISTIANA   +1 more
openaire   +2 more sources

System level reliability in convolution computations

IEEE Transactions on Acoustics, Speech, and Signal Processing, 1989
The author demonstrates how generalized cyclic codes, defined over the rings and fields usually used in high-speed convolution of discrete-time sequence processing, can be incorporated directly and quite naturally within the data processing of such arithmetic systems.
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System-level reliability using component-level failure signatures

2012 IEEE International Reliability Physics Symposium (IRPS), 2012
System-level Mean Time Between Failures (MTBF) is usually evaluated using individual component-level reliability metrics. System-level failures are categorized by Reliability, Availability and Serviceability (RAS) metrics. However, RAS evaluation at the system-level requires precise mapping between component failure modes, their system failure ...
R. Wong   +3 more
openaire   +1 more source

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