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Simulation of Layer Thickness Measurement in Thin Multi-Layered Material by Variable-Focus Laser Ultrasonic Testing [PDF]

open access: yesSensors, 2023
Thin multi-layered materials are widely used in key structures of many high technology industries. To ensure the quality and safety of structures, layer thickness measurement by non-destructive testing (NDT) techniques is essential.
Jinxing Qiu   +3 more
doaj   +2 more sources

Enhanced Electromagnetic Ultrasonic Thickness Measurement with Adaptive Denoising and BVAR Spectral Extrapolation [PDF]

open access: yesSensors
Electromagnetic ultrasonic testing technology, owing to its couplant-free, high-temperature-resistant, and non-contact characteristics, exhibits unique advantages for thickness measurement in harsh industrial environments.
Lijun Ma   +4 more
doaj   +2 more sources

Measuring the Thickness of Fiber Mats Using Light Transmittance via Image Processing

open access: yesDüzce Üniversitesi Bilim ve Teknoloji Dergisi, 2023
Fiber materials possess unique properties, including a large active surface area, high surface-to-volume ratio, high porosity, high mechanical performance, and low density. Consequently, they serve as key components in various applications such as energy
Hercan Yavuztürk   +5 more
doaj   +1 more source

Simultaneous Measurement of Thickness and Elastic Properties of Thin Plastic Films by Means of Ultrasonic Guided Waves

open access: yesSensors, 2021
Ultrasonic guided waves are already used for material characterization. The advantage of these waves is that they propagate in the plane of a plate and their propagation characteristics are sensitive to properties of the material.
Rymantas Jonas Kažys, Olgirdas Tumšys
doaj   +1 more source

THz-TDS Techniques of Thickness Measurements in Thin Shim Stock Films and Composite Materials

open access: yesApplied Sciences, 2021
Terahertz wave (T-ray) scanning applications are one of the most promising tools for nondestructive evaluation. T-ray scanning applications use a T-ray technique to measure the thickness of both thin Shim stock films and GFRP (glass fiber-reinforced ...
Kwang-Hee Im   +4 more
doaj   +1 more source

Method for Film Thickness Mapping with an Astigmatic Optical Profilometer

open access: yesSensors, 2022
An astigmatic optical profilometer is a precision instrument with advantages such as high resolution, high bandwidth, a compact size, and low cost. However, current astigmatic optical profilometers measure only surface morphology, and their potential for
Hsien-Shun Liao   +2 more
doaj   +1 more source

Waveguide Structure Design and Simulation for High-Temperature Corrosion Thickness Detection

open access: yesApplied Sciences, 2022
Equipment corrosion often happens in the petrochemical industry, especially when high temperature materials are transported. The corrosion phenomenon should be monitored as a leak may occur due to corrosion and even cause fires and explosions.
Yan Li   +4 more
doaj   +1 more source

Calibration of Waveplate Retardance Fluctuation Due to Field-of-View Effect in Mueller Matrix Ellipsometer

open access: yesPhotonics, 2023
Leveraging their unique phase modulation characteristics, birefringent waveplates have been widely used in various optical systems. With the development of material science and manufacturing techniques, the polarization properties of waveplates have ...
Zhou Jiang   +3 more
doaj   +1 more source

Application of Adaptive Filtering Based on Variational Mode Decomposition for High-Temperature Electromagnetic Acoustic Transducer Denoising

open access: yesSensors, 2022
In high-temperature environments, the signal-to-noise ratio (SNR) of the signal measured by electromagnetic acoustic transducers (EMAT) is low, and the signal characteristics are difficult to extract, which greatly affects their application in practical ...
Shuaijie Zhao   +4 more
doaj   +1 more source

A Novel Approach for Measurement of Free-Form Optical Elements with Digital Holographic Microscopy

open access: yesMicromachines, 2022
Free-form optical elements face significant challenges in high-precision measurement due to their high complexity and non-rotational symmetry. Digital holographic microscopy (DHM), as one of the methods for the measurement of free-form optical elements ...
Xuhui Zhang   +4 more
doaj   +1 more source

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