Results 11 to 20 of about 507,445 (265)

The use of a two-frequency eddy current method for measuring the electrically conductive wall thickness under significant variations in the test parameter and the lift-off

open access: yesҚарағанды университетінің хабаршысы. Физика сериясы, 2022
The paper addresses the problem of eddy current testing of the wall thickness of light-alloy drill pipes under significant variations in both the test and the influence parameter of the test object – the lift-off between the eddy current probe and the ...
A.E. Гольдштейн   +1 more
doaj   +1 more source

Research on Identification and Detection of Aluminum Plate Thickness Step Change Based on Electromagnetic Acoustic Resonance

open access: yesMagnetochemistry, 2023
The conventional ultrasonic thickness measurement method is ineffective in detecting the measured specimen with a step change in thickness as it is easy to cause multimode acoustic mixing in the ultrasonic detection process.
Zhichao Cai   +3 more
doaj   +1 more source

Theoretical and Experimental Research on Terahertz Metamaterial Sensor With Flexible Substrate

open access: yesIEEE Photonics Journal, 2022
A terahertz metamaterial refractive index/thickness sensor with flexible substrate, exhibiting low-frequency Fano resonance and high-frequency electromagnetically induced transparent (EIT) resonance, is proposed.
Haizi Yao   +4 more
doaj   +1 more source

Mitigation of the effect of variations in the electrical conductivity of the material via two-frequency eddy current testing of the thickness of the electrically conductive wall under significantly varying influence parameters

open access: yesҚарағанды университетінің хабаршысы. Физика сериясы, 2023
The paper analyzes feasibility of the two-frequency eddy current method for measuring the thickness of an electrically conductive wall under significantly varying test and influence parameters of the test object — the lift-off between the eddy current ...
A.E. Гольдштейн   +1 more
doaj   +1 more source

Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure

open access: yesSensors, 2020
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface.
Zheyu Wu   +6 more
doaj   +1 more source

Development of free curved plate thickness measurement system - Improvement of interpolation for continuous path -

open access: yesJournal of Advanced Mechanical Design, Systems, and Manufacturing, 2014
A method to generate a high-continuity thickness measuring path has been proposed in our own developed automatic system using laser displacement sensors and an industrial robot to measure and evaluate a free curved plate thickness.
Yurie OKUGAWA   +2 more
doaj   +1 more source

Local Thickness Measurement in TEM [PDF]

open access: yesMicroscopy and Microanalysis, 2010
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Zhang, Huairuo   +2 more
openaire   +1 more source

Sparrow: A Magnetic Climbing Robot for Autonomous Thickness Measurement in Ship Hull Maintenance

open access: yesJournal of Marine Science and Engineering, 2020
The maintenance of ship hulls involves a series of routine tasks during dry-docking that renews its life-time and operating efficiency. One such task is hull inspection, which is always seen as harmful for human operators and a time-consuming task.
Raihan Enjikalayil Abdulkader   +5 more
doaj   +1 more source

Correction of Thickness Measurement by Ultrasound for Articular Cartilage Using Sound Velocity Estimation

open access: yesJournal of Biomechanical Science and Engineering, 2010
Background. Ultrasound measurement of osteoarthritis cartilage thickness is not sufficiently accurate if constant sound velocity is used. The aim of this study was to investigate the applicability of estimating the sound velocity using echo reflectance ...
Keisuke YAMADA   +3 more
doaj   +1 more source

An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer

open access: yesSensors, 2019
Thin films are a type of coating that have a very wide spectrum of applications. They may be used as single layers or composed in multilayer stacks, which significantly extend their applications.
Artur Zarzycki   +4 more
doaj   +1 more source

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