Results 271 to 280 of about 219,369 (310)
Some of the next articles are maybe not open access.
Time-of-Flight Secondary Ion Mass Spectrometry
2008Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components.
Dieter Pleul, Frank Simon
openaire +1 more source
Membrane introduction/laser photoionization time-of-flight mass spectrometry
Chemosphere, 2007Two-photon resonance enhanced multiphoton ionization (REMPI) has been shown to be a unique ionization method for mass spectrometry, exhibiting both high sensitivity and chemical selectivity. Because REMPI is a gas-phase method, its applications have been limited either to direct analysis of vapor phase samples, or in conjunction with an initial laser ...
Harald, Oser +5 more
openaire +2 more sources
Inductively Coupled Plasma Zoom–Time-of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry, 2015A zoom-time-of-flight mass spectrometer has been coupled to an inductively coupled plasma (ICP) ionization source. Zoom-time-of-flight mass spectrometry (zoom-TOFMS) combines two complementary types of velocity-based mass separation. Specifically, zoom-TOFMS alternates between conventional, constant-energy acceleration (CEA) TOFMS and energy-focused ...
Elise A, Dennis +3 more
openaire +2 more sources
An introduction to quadrupole–time‐of‐flight mass spectrometry
Journal of Mass Spectrometry, 2001AbstractA brief introduction is presented to the basic principles and application of a quadrupole–time‐of‐flight (TOF) tandem mass spectrometer. The main features of reflecting TOF instruments with orthogonal injection of ions are discussed. Their operation and performance are compared with those of triple quadrupoles with electrospray ionization and ...
I V, Chernushevich +2 more
openaire +2 more sources
Matrix-Assisted Laser Desorption Time of Flight Mass Spectrometry
Clinics in Laboratory Medicine, 2018Matrix-assisted laser desorption time of flight mass spectrometry (MALDI-TOF MS), adapted for use in clinical microbiology laboratories, challenges current standards of microbial detection and identification. This article summarizes the capabilities of MALDI-TOF MS in diagnostic clinical microbiology laboratories and describes the underpinnings of the ...
Donna M, Wolk, Andrew E, Clark
openaire +2 more sources
Time-of-flight mass spectrometry for time-resolved measurements
Review of Scientific Instruments, 2007A time-resolved time-of-flight mass spectrometer (TOF-MS) that can simultaneously monitor multiple species on the millisecond time scale has been constructed. A pulsed photolysis laser is used to initiate reaction, and then via a pinhole the reaction mixture is sampled by the TOF-MS.
Mark A, Blitz +3 more
openaire +2 more sources
A tandem quadrupole/time-of-flight instrument for mass spectrometry/mass spectrometry
Analytical Chemistry, 1984A new tandem mass spectrometer for MS/MS studies is described. The instrument consists of a quadrupole mass filter followed by a time-of-flight mass analyzer. A collision cell is located in the region between the two analyzers. Low-energy parent ions (< 100 eV) are mass analyzed by the quadrupole and injected into the collision cell. Daughter ions from
Gary L. Glish, Douglas E. Goeringer
openaire +1 more source
Time-of-Flight Secondary Ion Mass Spectrometry
2018Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful surface analysis methods in terms of high sensitivity, high spatial resolution imaging, and detailed chemical information.
openaire +1 more source
Time‐of‐flight mass spectrometry: Introduction to the basics
Mass Spectrometry Reviews, 2016The intention of this tutorial is to introduce into the basic concepts of time‐of‐flight mass spectrometry, beginning with the most simple single‐stage ion source with linear field‐free drift region and continuing with two‐stage ion sources combined with field‐free drift regions and ion reflectors—the so‐called reflectrons. Basic formulas are presented
openaire +2 more sources