Time Of Flight Secondary Ion Mass spectrometry: Chemical Imaging [PDF]
Microscopy and Microanalysis, 2016 Sachin Attavar +3 more
openaire +1 more source
ToF-SIMS spectral data analysis of Paenibacillus sp. 300A biofilms and planktonic cellsIEEE DataPort
Data in BriefAnalysis of bacterial biofilms is particularly challenging and important with diverse applications from systems biology to biotechnology. Among the variety of techniques that have been applied, time-of-flight secondary ion mass spectrometry (ToF-SIMS ...
Gabriel D. Parker +3 more
doaj +1 more source
Comment on "Which fraction of stone wool fibre surface remains uncoated by binder? A detailed analysis by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy" by Hirth et al., 2021, RSC Adv., 11, 39545, DOI: 10.1039/d1ra06251d. [PDF]
RSC Adv, 2023 Okhrimenko DV +5 more
europepmc +1 more source
Reply to comment on "which fraction of stone wool fibre surface remains uncoated by binder? A detailed analysis by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy" by Hirth et al., 2021, RSC Adv., 11, 39545, DOI: 10.1039/d1ra06251d". [PDF]
RSC Adv, 2023 Hirth S, Wohlleben W, Waindok H.
europepmc +1 more source
Which fraction of stone wool fibre surface remains uncoated by binder? A detailed analysis by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy. [PDF]
RSC Adv, 2021 Hirth S, Waindok H, Wohlleben W.
europepmc +1 more source
MEMS Mass Spectrometers: the Next Wave of Miniaturization [PDF]
, 2015 Syms, R, Wright, S
core +1 more source
Dynamics of Molecules Observed at Crude-Oil-Gas Interfaces by Time-of-Flight Secondary Ion Mass Spectrometry Imaging. [PDF]
J Am Soc Mass Spectrom, 2020 Arisz PWF, Pureveen JBM, Heeren RMA.
europepmc +1 more source
Comparison of Mg-based liquid metal ion sources for scalable focused-ion-implantation doping of GaN
AIP AdvancesWe compare the suitability of various magnesium-based liquid metal alloy ion sources (LMAISs) for scalable focused-ion-beam (FIB) implantation doping of GaN. We consider GaMg, MgSO4●7H2O, MgZn, AlMg, and AuMgSi alloys. Although issues of oxidation (GaMg),
Michael Titze +10 more
doaj +1 more source
Imaging Plant Using Time-of-Flight Secondary Ion Mass Spectrometry [PDF]
Microscopy and Microanalysis, 2018 Xiao-Ying Yu +3 more
openaire +1 more source
Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry. [PDF]
ACS Appl Energy Mater, 2020 Wheatcroft L +6 more
europepmc +1 more source