Results 151 to 160 of about 75,094 (189)

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

1996
Secondary ion mass spectrometry in the “static mode” is becoming a key technique for the surface characterization of organic materials. This is due to the very specific chemical information derived from characteristic molecular secondary ions. The present expansion of this technique is related to the development of high performance time-of-flight mass ...
Patrick Bertrand, Weng Lu-Tao
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Time-of-Flight Measurements in Secondary Ion Mass Spectrometry

1986
In recent years a number of mass spectrometers have been constructed for measuring the mass spectra of secondary ions by time-of-flight methods [1]. References The secondary ions may be produced by bombardment of the sample with high energy (MeV) primary ions [2] or with low-energy (keV) ions.
K. G. Standing, R. Beavis, G. Bolbach, W. Ens, D. E. Main, B. Schueler   +5 more
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Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe

Journal of Electronic Materials, 2007
In this study, time-of-flight (TOF) secondary ion mass spectrometry (SIMS) was compared against dynamic SIMS to determine detection limits and background levels for nine impurities: Li, Na, K, Al, Ni, As, In, Fe, and Cu. Statistics were gathered by measuring six material test structure samples from six different liquid phase epitaxy (LPE) HgCdTe double
Steve Price, Larry Wang, Alice Wang, Arwa Ginwalla, Ian Mowat   +4 more
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Identification of human calculi with time‐of‐flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry, 2009
Abstract Time‐of‐flight secondary ion mass spectrometry was used to study four human calculi and to compare the results with those from twelve commercially available urinary calculi minerals including three organic compounds (L‐cystine, uric acid and sodium urate).
C Amjad A, Ghumman, Olga M T, Carreira, Augusto M C, Moutinho, Alexander, Tolstogouzov, Valentina, Vassilenko, Orlando M N D, Teodoro   +5 more
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Application of Time-of-flight Secondary Ion Mass Spectrometry in Lithium-ion Batteries

Current Analytical Chemistry
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is becoming a powerful tool in the Lithium-Ion Batteries (LIBs) field due to its excellent resolution and sensitivity, as well as its ability to provide spectrally and depth-resolved information. The perspective comprehensively delves into the application of ToF-SIMS in two major areas of LIBs
Pengwei Li, Xiaoning Xia
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Ion-to-neutral conversion in time-of-flight secondary ion mass spectrometry

Applied Surface Science, 2003
Abstract Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to explore ion-to-neutral conversion on a microsecond time scale. A membrane lipid served as a sample. Neutrals generated from positive ions exhibited rather broad lines in the TOF spectrum, indicating significant transfer of kinetic energy during fragmentation.
W. Szymczak, K. Wittmaack
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Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope

Microscopy and Microanalysis, 2006
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3 ...
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Peptide Analysis by Time-of-flight Secondary Ion Mass Spectrometry

1989
High sensitivity, specifity and speed are widely recognized characteristics of mass spectrometry which make it suitable for the analysis of peptides and their posttranslational modifications [Ben87].
A. Benninghoven, B. Hagenhoff, R. Kock, G. Assman, M. Walter   +4 more
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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

Mikrochimica Acta, 1996
Polyisoprenes (PIPs) with average molecular weights from 650 to 800,000 Da have been studied by time-of-flight secondary ion mass Spectrometry (TOF-SIMS) in the static mode. Polymer samples were bombarded by argon primary ions, and positive SIMS spectra were collected. Effects of branching and unsaturation in the polymer structure on ion formation were
Keyang Xu, Andrew Proctor, David M. Hercules   +2 more
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Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Proceedings, annual meeting, Electron Microscopy Society of America, 1990
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition
Bruno Schueler, Robert W. Odom
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