Results 81 to 90 of about 20,232 (192)

TOF-SIMS Imaging of Lipids on Rat Brain Sections

, 2014
Since several decades, secondary ion mass spectrometry (SIMS) coupled to time of flight (TOF) is used for atomic or small inorganic/organic fragments imaging on different materials. With the advent of polyatomic ion sources leading to a significant increase of sensitivity in combination with a reasonable spatial resolution (1-10 μm), TOF-SIMS is ...
Touboul, David, Brunelle, Alain
openaire   +3 more sources

Studies on temperature dependent semiconductor to metal transitions in ZnO thin films sparsely doped with Al

, 2012
For a detailed study on the semiconductor to metal transition (SMT) in ZnO thin films doped with Al in the concentration range from 0.02 to 2%, we grew these films on (0001) sapphire substrates using sequential pulsed laser deposition.
Ajimsha, R. S., Bose, A., Das, Amit K., Joshi, S. C., Kukreja, L. M., Misra, P., Phase, D. M.   +6 more
core   +1 more source

Increase of Compact Bone Thickness in Rat Tibia after Implanting MgO into the Bone Marrow Cavity

Journal of Functional Biomaterials, 2014
The effect of implanting MgO paste into the bone marrow of rat tibia, was studied by light microscopy, time of flight-secondary ion mass spectrometry (ToF-SIMS), and environmental scanning electron microscopy (ESEM), and energy dispersive X-ray (EDX ...
Håkan Nygren, Mobina Chaudhry, Stefan Gustafsson, Göran Kjeller, Per Malmberg, Kjell-Erik Johansson   +5 more
doaj   +1 more source

Influence of annealing parameters on the ferromagnetic properties of optimally passivated (Ga,Mn)As epilayers

, 2005
The influence of annealing parameters - temperature and time - on the magnetic properties of As-capped (Ga,Mn)As epitaxial thin films have been investigated. The dependence of the transition temperature (Tc) on annealing time marks out two regions.
Adell, M., Bexell, U., Kanski, J., Sadowski, J., Stanciu, V., Svedlindh, P., Warnicke, P., Wilhelmsson, O.   +7 more
core   +1 more source

ToF-SIMS Investigation of the Effectiveness of Acid-Cleaning procedures for Genesis Solar Wind Collectors [PDF]

ToF-SIMS images of Genesis sample surfaces contain an incredible amount of important information, but they also show that the crash-derived surface contamination has many components, presenting a challenge to cleaning.
Burnett, D. S., Gonzalez, C. P., Goreva, Y. S., Humanyun, M., Jurewicz, A. J.   +4 more
core   +1 more source

ToF-SIMS spectral analysis of pristine and neutron irradiated single crystal tungstenIEEE Data Portal

Results in Surfaces and Interfaces
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has many promising features in studying materials including high spatial resolution and high mass accuracy of elements, molecules, and isotopes.
Gabriel D. Parker, Tobias K. Misicko, Tanguy Teriler, Yang Xiao, Xiao-Ying Yu   +4 more
doaj   +1 more source

Structures of Pb-BHA Complexes Adsorbed on Scheelite Surface

Frontiers in Chemistry, 2019
Previous studies have shown that Pb-BHA complexes (lead complexes of benzohydroxamic acid) have better collecting ability and can be used in flotation experiments with BHA acting as a collector and lead ions acting as activators.
Zhao Wei, Zhao Wei, Wenjuan Sun, Wenjuan Sun, Yuehua Hu, Yuehua Hu, Haisheng Han, Haisheng Han, Wei Sun, Wei Sun, Ruolin Wang, Ruolin Wang, Yangge Zhu, Bicheng Li, Zhenguo Song   +14 more
doaj   +1 more source

Imaging analysis of LDEF craters [PDF]

Two small craters in Al from the Long Duration Exposure Facility (LDEF) experiment tray A11E00F (no. 74, 119 micron diameter and no. 31, 158 micron diameter) were analyzed using Auger electron spectroscopy (AES), time-of-flight secondary ion mass ...
Bunch, T. E., Chakel, J. A., Fleming, R. H., Harris, D. W., Radicatidibrozolo, F.   +4 more
core   +1 more source

Hafnium carbide formation in oxygen deficient hafnium oxide thin films

, 2016
On highly oxygen deficient thin films of hafnium oxide (hafnia, HfO$_{2-x}$) contaminated with adsorbates of carbon oxides, the formation of hafnium carbide (HfC$_x$) at the surface during vacuum annealing at temperatures as low as 600 {\deg}C is ...
Alff, L., Breuer, U., Hildebrandt, E., Komissinskiy, P., Kurian, J., Rodenbücher, C., Sharath, S. U., Szot, K., Waser, R.   +8 more
core   +1 more source

Polymer surface structures determined using ToF-SIMS

Reviews in Analytical Chemistry, 2014
This article reviews the recent applications of time-of-flight secondary ion mass spectrometry in the determination of surface structures of semicrystralline and amorphous polymer films. Examples given include the determination of end-group distributions
Chan Chi-Ming, Weng Lu-Tao, Lau Yiu-Ting R.   +2 more
doaj   +1 more source