Results 141 to 150 of about 10,323 (170)
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Transient faults and network reliability

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720), 2005
This work develops a method for the quantitative analysis of network reliability in the presence of both permanent and transient faults. Even though transient noise is considered a common occurrence in networks, a survey of the literature reveals an emphasis on permanent faults.
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The Spectra of Fault-Induced Transients

IEEE Transactions on Power Apparatus and Systems, 1979
During the first cycle or two following a power system fault, a high-speed protective relay is expected to make a decision as to the severity or location of the fault, usually based on 60 Hz information, i.e. the phase and magnitude of 60 Hz voltage or current signals. It is precisely at this time however that the signal is badly corrupted by noise, in
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Edge Coloring Despite Transient and Permanent Faults

2014
We consider the problem of edge coloring in the presence of transient and permanent faults: we must achieve a stable edge coloring despite any initial state, and despite an unbounded number of Byzantine nodes. In this paper, we consider that no local variable is allowed: we only use the colors of the edges.
Alexandre Maurer, Toshimitsu Masuzawa
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Formal Development of Mechanisms for Tolerating Transient Faults

2006
Transient faults belong to a wide-spread class of faults typical for control systems. These are the faults that only appear for a short period of time and might reappear later. However, even by appearing for a short time, they might cause dangerous system errors.
Dubravka Ilic   +3 more
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Transient Fault Current Analysis of IIRESs Considering Controller Saturation

IEEE Transactions on Smart Grid, 2022
Bin Yang, Ke Jia, Tianshu Bi
exaly  

Rolling bearing fault diagnosis using transient-extracting transform and linear discriminant analysis

Measurement: Journal of the International Measurement Confederation, 2021
Yuguo Zhou
exaly  

Experiments with Transient Fault Upsets in Microprocessor Controllers

1987
Original fault and error insertion experiments determining the effects of transient faults in microprocessor controllers are described. The fault insertion experiments qualify most probable errors (logical level) which are caused by transient faults resulting from electrical noise.
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Transient Fault Analysis Method for VSC-Based DC Distribution Networks With Multi-DGs

IEEE Transactions on Industrial Informatics, 2022
, Zhengyou He
exaly  

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